Abstract: Provided is an operation method for a digital hologram implementation device including a backlight and a spatial light modulator, the operation method including setting an initial phase value of an optical signal to a remedy phase, computing a reduced phase based on the remedy phase, correcting the remedy phase based on a difference between the reduced phase and a preset optimized phase, determining whether the corrected remedy phase is a stabilized phase, performing forward propagation on the stabilized phase and an amplitude of the optical signal, correcting the amplitude of the optical signal, performing backward propagation on the corrected amplitude and the stabilized phase, and determining whether a phase derived by the backward propagation is an optimized phase.

Abstract: The present disclosure relates to methods of treating a cancer (or a tumor) with an IL-7 protein in combination with a multispecific (e.g., bispecific) antibody.

Abstract: The present disclosure relates to methods of treating a cancer (or a tumor) with an IL-7 protein in combination with an immune checkpoint inhibitor, such as a PD-1 antagonist (e.g., anti-PD-1 antibody) or a CTLA-4 antagonist (e.g., anti-CTLA-4 antibody).

Abstract: A display device includes a cradle and a display module. The cradle includes a signal transmission unit configured to transmit an image signal, a housing exposing the signal transmission unit. The display module has a curved shape along a radius of a curvature and includes a signal reception unit configured to receive the image signal, an image display unit configured to display an image based on the image signal, and a second coupling member. The display device is configured to operate in any one of a first state and a second state, in which during the first state, the cradle and the display module are decoupled from each other, and in which during the second state, the first coupling member and the second coupling member are slide-coupled to each other, such that the display module moves along the circumference of a circle of the curvature of the display module.

Abstract: A display device includes a cradle and a display module. The cradle includes a signal transmission unit configured to transmit an image signal, a housing exposing the signal transmission unit. The display module has a curved shape along a radius of a curvature and includes a signal reception unit configured to receive the image signal, an image display unit configured to display an image based on the image signal, and a second coupling member. The display device is configured to operate in any one of a first state and a second state, in which during the first state, the cradle and the display module are decoupled from each other, and in which during the second state, the first coupling member and the second coupling member are slide-coupled to each other, such that the display module moves along the circumference of a circle of the curvature of the display module.

Abstract: In a method of detecting a defect on an object, a preliminary reference image can be obtained from a plurality of comparison regions defined on the object. The preliminary reference image is divided into reference zones by a similar brightness. Each of the reference zones is provided with substantially the same gray level, respectively, to obtain a reference image. Whether a defect exists in an inspection region in the comparison regions is determined using the reference image. Thus, defects in the inspection regions having different brightnesses can be detected using the properly obtained reference image.

Abstract: A test structure includes a transistor, a dummy transistor and a pad unit. The transistor is formed on a first active region of a substrate. The dummy transistor is formed on a second active region of the substrate and electrically connected to the transistor. The pad unit is electrically connected to the transistor. Plasma damage to the transistor is reduced due to the presence of dummy transistor.

Abstract: In a method of detecting a defect on an object, a preliminary reference image can be obtained from a plurality of comparison regions defined on the object. The preliminary reference image is divided into reference zones by a similar brightness. Each of the reference zones is provided with substantially the same gray level, respectively, to obtain a reference image. Whether a defect exists in an inspection region in the comparison regions is determined using the reference image. Thus, defects in the inspection regions having different brightnesses can be detected using the properly obtained reference image.

Abstract: A test structure includes a transistor, a dummy transistor and a pad unit. The transistor is formed on a first active region of a substrate. The dummy transistor is formed on a second active region of the substrate and electrically connected to the transistor. The pad unit is electrically connected to the transistor. Plasma damage to the transistor is reduced due to the presence of dummy transistor.

Abstract: An isolation layer having a first depth is formed from an upper face of a substrate. Source/drain regions including junctions are formed in the substrate. Each of the junctions has a second depth substantially smaller than the first depth. A first recess is formed in the substrate by a first etching process. A protection layer pattern is formed on a sidewall of the first recess. A second recess is formed beneath the first recess. The second recess has a width substantially larger than that of the first recess. The second recess is formed by a second etching process using an etching gas containing an SF6 gas, a Cl2 gas and an O2 gas. A gate insulation layer is formed on surfaces of the first and the second recesses. The second recess having an enlarged shape may reduce a width of the junction between the gate electrode and the isolation layer so that a leakage current generated through the junction may decrease.