Patents by Inventor Jimin Woo

Jimin Woo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Mask inspection apparatus and mask inspection method using the same
    Patent number: 12045975
    Abstract: A mask inspection method includes photographing a cell mask through which openings is formed to obtain an image, setting an area of the image adjacent to an edge of the cell mask as an inspection area, comparing a grayscale of the openings in the inspection area with a reference grayscale, and checking a defect of the cell mask according to a result of the comparing of the grayscale of the openings.
    Type: Grant
    Filed: June 29, 2021
    Date of Patent: July 23, 2024
    Assignee: SAMSUNG DISPLAY CO., LTD.
    Inventors: Ilha Song, Mihye Kwon, Jimin Woo, Sangdon Hwang
  • Mask inspection apparatus and mask inspection method using the same
    Patent number: 11961222
    Abstract: A mask inspection method including the steps of obtaining an image of a mask including a first region having a plurality of first openings, and a second region having a plurality of second openings, sectioning the image into a first partial image corresponding to the first region and a second partial image corresponding to the second region, respectively, inspecting the first region of the mask based on the first partial image, and inspecting the second region of the mask based on the second partial image.
    Type: Grant
    Filed: April 20, 2021
    Date of Patent: April 16, 2024
    Assignees: Samsung Display Co., Ltd., HIMS CO., LTD.
    Inventors: Sangdon Hwang, BongSuk Kim, TaeHyun Kim, Mihye Kwon, Ilha Song, Jimin Woo
  • MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD USING THE SAME
    Publication number: 20220114714
    Abstract: A mask inspection method includes photographing a cell mask through which openings is formed to obtain an image, setting an area of the image adjacent to an edge of the cell mask as an inspection area, comparing a grayscale of the openings in the inspection area with a reference grayscale, and checking a defect of the cell mask according to a result of the comparing of the grayscale of the openings.
    Type: Application
    Filed: June 29, 2021
    Publication date: April 14, 2022
    Applicant: Samsung Display Co., Ltd.
    Inventors: ILHA SONG, MIHYE KWON, JIMIN WOO, SANGDON HWANG
  • MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD USING THE SAME
    Publication number: 20210350514
    Abstract: A mask inspection method including the steps of obtaining an image of a mask including a first region having a plurality of first openings, and a second region having a plurality of second openings, sectioning the image into a first partial image corresponding to the first region and a second partial image corresponding to the second region, respectively, inspecting the first region of the mask based on the first partial image, and inspecting the second region of the mask based on the second partial image.
    Type: Application
    Filed: April 20, 2021
    Publication date: November 11, 2021
    Inventors: Sangdon Hwang, BongSuk Kim, TaeHyun Kim, Mihye Kwon, Ilha Song, Jimin Woo