Abstract: An optical recoding carrier and an information recording method applying an amplitude shift keying (ASK) method or further a DC-biased ASK method are provided, wherein at least one periodically undulated section and at least one non-periodically undulated section are formed on the optical recording carrier to indicate specific information. The information recording method can be embodied as an addressing method of an optical disk for recording address information of tracks of the optical disk. A continuous track structure is provided on the optical recording carrier to save the available recording space and improve the information reading precision of the optical recording carrier. Furthermore, a signal generating apparatus and an information reading apparatus applied in the information recording method are provided.

Abstract: An optical recoding carrier and an information recording method applying an amplitude shift keying (ASK) method or further a DC-biased ASK method are provided, wherein at least one periodically undulated section and at least one non-periodically undulated section are formed on the optical recording carrier to indicate specific information. The information recording method can be embodied as an addressing method of an optical disk for recording address information of tracks of the optical disk. A continuous track structure is provided on the optical recording carrier to save the available recording space and improve the information reading precision of the optical recording carrier. Furthermore, a signal generating apparatus and an information reading apparatus applied in the information recording method are provided.

Abstract: A method for measuring a surface structure of a near-field object is provided. A light source produces at least a first light beam and a second light beam; guiding the first light beam and the second light beam to enter the SIL for interacting with the object surface. This method can be used in, for example, a near-field optical disc storage system, wherein reflection intensities of the first and second light beams are used to measure two distances between the SIL and the optical disc at two positions corresponding to the first and second light beams. A surface structure, such as a tilt angle or an average distance between the disc and the SIL or disc roughness, is obtained by analyzing the above-mentioned positions and distances. The first and second light beams are produced, for example, by a diffraction technology or by a single laser diode with multiple beams.