Patents by Inventor Ji-Young Son

Ji-Young Son has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for testing a semiconductor device
    Patent number: 8248089
    Abstract: An apparatus for testing an electrical property of a semiconductor device includes a substrate support unit, a tester head above the substrate support unit, the tester head including a base, a probe card connected to the base of the tester head, and a temperature control unit within the base of the tester head, the temperature control unit being configured to control temperature of the probe card by heat transfer with the probe card.
    Type: Grant
    Filed: February 4, 2010
    Date of Patent: August 21, 2012
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: JaeHyun Yang, Soomin Byun, Kunhyung Lee, Ji-Young Son
  • Apparatus for testing semiconductor device
    Publication number: 20100207653
    Abstract: An apparatus for testing an electrical property of a semiconductor device includes a substrate support unit, a tester head above the substrate support unit, the tester head including a base, a probe card connected to the base of the tester head, and a temperature control unit within the base of the tester head, the temperature control unit being configured to control temperature of the probe card by heat transfer with the probe card.
    Type: Application
    Filed: February 4, 2010
    Publication date: August 19, 2010
    Inventors: JaeHyun Yang, Soomin Byun, Kunhyung Lee, Ji-Young Son