Patents by Inventor Jia-Hong ZHANG

Jia-Hong ZHANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11797646
    Abstract: A method for standardizing image annotation includes receiving a defect pattern; marking an image according to the defect pattern to generate a first judgement result; marking the image according to the defect pattern to generate a second judgement result; comparing the first judgement result and the second judgement result to obtain a comparison result; and updating the defect pattern according to the comparison result to standardize the defect pattern. The method for standardizing image annotation of the present specification can improve the marking stability of the training data of a trained image recognition algorithm, thereby improving the accuracy of image recognition of the trained image recognition algorithm.
    Type: Grant
    Filed: March 11, 2021
    Date of Patent: October 24, 2023
    Assignee: WISTRON CORP
    Inventors: Ting-Chieh Lu, Ching Ming Chen, Yun-Yuan Tsai, Shi Xiang Chen, Jia-Hong Zhang
  • Publication number: 20230066499
    Abstract: A method for establishing a defect detection model and an electronic apparatus are provided. A first classification model is established based on a training sample set including a plurality of training samples. The training samples are respectively input to the first classification model to obtain a classification result of each training sample. A plurality of outlier samples that are classified incorrectly are obtained from the training samples based on the classification result. A part of outlier samples that are classified incorrectly is deleted from the training samples, and the remaining training samples are used as an optimal sample set. A second classification model is established based on the optimal sample set so as to perform a defect detection through the second classification model.
    Type: Application
    Filed: October 14, 2021
    Publication date: March 2, 2023
    Applicant: Wistron Corporation
    Inventors: Jia-Hong Zhang, Shih-Yi Chao
  • Publication number: 20220171993
    Abstract: A method for standardizing image annotation includes receiving a defect pattern; marking an image according to the defect pattern to generate a first judgement result; marking the image according to the defect pattern to generate a second judgement result; comparing the first judgement result and the second judgement result to obtain a comparison result; and updating the defect pattern according to the comparison result to standardize the defect pattern. The method for standardizing image annotation of the present specification can improve the marking stability of the training data of a trained image recognition algorithm, thereby improving the accuracy of image recognition of the trained image recognition algorithm.
    Type: Application
    Filed: March 11, 2021
    Publication date: June 2, 2022
    Inventors: Ting-Chieh LU, Ching Ming CHEN, Yun-Yuan TSAI, Shi Xiang CHEN, Jia-Hong ZHANG
  • Patent number: 10402623
    Abstract: A large scale cell image analysis method and system are provided. The method includes: obtaining a cell image; performing a region segmentation process; and performing a feature calculation process. The region segmentation process includes: performing a statistical intensity algorithm according to the cell image to calculate a first threshold and a second threshold; dividing the cell image into a background region and a cell region according to the first threshold; performing an average intensity process according to the cell region to calculate a third threshold and a fourth threshold; and dividing the cell region into a cytoplasmic region and a nucleus region according to the third threshold and the fourth threshold. The feature calculation process calculates at least one feature at least according to the cell region, the nucleus region, and the cytoplasmic region.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: September 3, 2019
    Assignee: METAL INDUSTRIES RESEARCH & DEVELOPMENT CENTRE
    Inventors: Jia-Hong Zhang, Yan-Jun Chen, Yu-Fen Kuo
  • Publication number: 20190163950
    Abstract: A large scale cell image analysis method and system are provided. The method includes: obtaining a cell image; performing a region segmentation process; and performing a feature calculation process. The region segmentation process includes: performing a statistical intensity algorithm according to the cell image to calculate a first threshold and a second threshold; dividing the cell image into a background region and a cell region according to the first threshold; performing an average intensity process according to the cell region to calculate a third threshold and a fourth threshold; and dividing the cell region into a cytoplasmic region and a nucleus region according to the third threshold and the fourth threshold. The feature calculation process calculates at least one feature at least according to the cell region, the nucleus region, and the cytoplasmic region.
    Type: Application
    Filed: November 30, 2017
    Publication date: May 30, 2019
    Inventors: Jia-Hong ZHANG, Yan-Jun CHEN, Yu-Fen KUO