Abstract: A testing assembly for testing a magnetic sensor comprises a testing interface and a detachable magnetic-field generator. The testing interface has a base plate and plurality of testing terminals. The base plate has a first side and a second side opposite to the first side. The plurality of testing terminals is arranged on the first side of the base plate. The detachable magnetic-field generator is arranged on the second side of the base plate in a detachable fashion. The detachable magnetic-field generator has a coil support and at least one coil winding around the coil support.

Abstract: A single-chip three-axis magnetic field sensing device is provided. This single-chip three-axis magnetic field sensing device comprises a substrate, a first sensing module, a second sensing module, a third sensing module and at least one coil. The substrate includes a surface. The first sensing module comprises at least one first magnetoresistive element and is configured to sense a first magnetic field component substantially parallel to the surface. The second sensing module comprises at least one second magnetoresistive element and is configured to sense a second magnetic field component substantially parallel to the surface. The third sensing module comprises at least one third magnetoresistive element and is configured to sense a third magnetic field component substantially perpendicular to the surface. Wherein one of the first magnetoresistive element and the second magnetoresistive element and the third magnetoresistive element is disposed right above or right below the at least one coil.

Abstract: A testing assembly for testing a magnetic sensor comprises a testing interface and a detachable magnetic-field generator. The testing interface has a base plate and plurality of testing terminals. The base plate has a first side and a second side opposite to the first side. The plurality of testing terminals is arranged on the first side of the base plate. The detachable magnetic-field generator is arranged on the second side of the base plate in a detachable fashion. The detachable magnetic-field generator has a coil support and at least one coil winding around the coil support.

Abstract: A single-chip three-axis magnetic field sensing device is provided. This single-chip three-axis magnetic field sensing device comprises a substrate, a first sensing module, a second sensing module, a third sensing module and at least one coil. The substrate includes a surface. The first sensing module comprises at least one first magnetoresistive element and is configured to sense a first magnetic field component substantially parallel to the surface. The second sensing module comprises at least one second magnetoresistive element and is configured to sense a second magnetic field component substantially parallel to the surface. The third sensing module comprises at least one third magnetoresistive element and is configured to sense a third magnetic field component substantially perpendicular to the surface. Wherein one of the first magnetoresistive element and the second magnetoresistive element and the third magnetoresistive element is disposed right above or right below the at least one coil.

Abstract: A method for measuring hysteresis curves and anisotropic energy of magnetic memory units is disclosed. It comprises gradually applying different magnetic fields to a single-layer or a multilayer magnetic structure (such as a MRAM memory unit) by extra ordinary Hall effect, and recording the variation of the Hall voltage to obtain the hysteresis curve and anisotropic energy with specific instruments, and calculating the individual anisotropic energy value of the magnetic material of the single-layer or the multilayer magnetic structure.

Abstract: A method for measuring hysteresis curves and anisotropic energy of magnetic memory units is disclosed. It comprises gradually applying different magnetic fields to a single-layer or a multilayer magnetic structure (such as a MRAM memory unit) by extra ordinary Hall effect, and recording the variation of the Hall voltage to obtain the hysteresis curve and anisotropic energy with specific instruments, and calculating the individual anisotropic energy value of the magnetic material of the single-layer or the multilayer magnetic structure.

Abstract: A method of measuring sub-micrometer hysteresis loops of a magnetic film is provided. First, a magnetic field is applied to a sample of a magnetic film, and a polarization microscope is used to observe an analytical area of the sample. Next, the observed dynamic video is converted to many digital pictures stored in chronological order. Then, the grayscale values of each selected pixel are read and converted to the corresponding relative magnetic moments, and hysteresis loops of each selected pixel are drawn.