Abstract: A test signal transmission apparatus used in a multi-chassis test device is provided. The test signal transmission apparatus includes global buses and test signal transmission modules each including an I/O port coupled to a test controller, a test bus coupled to an in-circuit-tester system and a bridge matrix including an output unit and an input unit. The output unit either routes a first output signal from the I/O port to the test bus, or routes the first output signal to one of the global buses and routes a second output signal from another one of the global buses to the test bus. The input unit either routes a first input signal from the test bus to the I/O port, or routes the first input signal to one of the global buses and routes a second input signal from another one of the global buses to the I/O port.

Abstract: A test signal transmission apparatus used in a multi-chassis test device is provided. The test signal transmission apparatus includes global buses and test signal transmission modules each including an I/O port coupled to a test controller, a test bus coupled to an in-circuit-tester system and a bridge matrix including an output unit and an input unit. The output unit either routes a first output signal from the I/O port to the test bus, or routes the first output signal to one of the global buses and routes a second output signal from another one of the global buses to the test bus. The input unit either routes a first input signal from the test bus to the I/O port, or routes the first input signal to one of the global buses and routes a second input signal from another one of the global buses to the I/O port.