Abstract: In certain aspects, a first opening extending vertically through a first dielectric deck including a first plurality of interleaved sacrificial layers and dielectric layers above a substrate is formed. A high-k dielectric layer and a channel sacrificial layer free of polysilicon are subsequently formed along a sidewall of the first opening. A second opening extending vertically through a second dielectric deck including a second plurality of interleaved sacrificial layers and dielectric layers on the first dielectric deck is formed to expose the channel sacrificial layer in the first opening. The channel sacrificial layer is removed in the first opening. A memory film and a semiconductor channel are subsequently formed over the high-k dielectric layer along sidewalls of the first and second openings.

Abstract: A method for knitting fall-plate structures on warp-knitting machines, including: the fall-plate guide bar makes an overlap when the groove needle bar is going upward and the previous loop is held by the sinker bar; the groove needle bar and the tongue bar simultaneously go downward but these two items are kept not closed, and the overlapped yarn and the previous loop are slipping inside together; the groove needle bar go upward again while both the fall-plate yarn and the previous loop are held by the sinker bar, making the two yarns slip out of the groove needle. Meanwhile, a ground guide bar makes an overlap, finishing lapping. When moving the groove needle bar downward for a second time, retreating the old loop and the pressed yarn; forming a new loop, by the ground yarn; placing the pressed yarn under the new loop; and forming the fall-plate structures.

Abstract: A substrate inspection device includes a laser emitting unit, arranged at one side of a transmission device, and configured to emit a laser beam to each substrate to be inspected on the transmission device when the substrate to be inspected is moved to an inspection position; a laser receiving unit, arranged at the other side of the transmission device, and configured to receive the laser beam transmitted through the substrate to be inspected; and a calculation unit, configured to calculate transmissibility of the laser beam relative to the substrate to be inspected based on an intensity of the laser beam emitted by the laser emitting unit and an intensity of the laser beam received by the laser receiving unit, and determine whether a line width of a black matrix in the substrate to be inspected is within a predetermined range of the line width based on the transmissibility.

Abstract: A method for forming yarn pressing weave by using a groove pin warp knitting machine based on servo driving. The method is performed on a Raschel groove pin warp knitting machine, and specifically comprises: a. enabling a groove pin body (3) to rise for a first time, utilizing a sinker (5) to press against an old coil, utilizing a yarn pressing guide comb (1) to perform traverse movement before the pin, and finishing yarn laying; b. enabling the groove pin body (3) and a groove pin core (4) to descend, enabling the groove pin body (3) to be kept open, and enabling pressed yarn (6) and the old coil not to undergo ring sleeving and to together move into a pin hook; c.

Abstract: A substrate inspection device includes a laser emitting unit, arranged at one side of a transmission device, and configured to emit a laser beam to each substrate to be inspected on the transmission device when the substrate to be inspected is moved to an inspection position; a laser receiving unit, arranged at the other side of the transmission device, and configured to receive the laser beam transmitted through the substrate to be inspected; and a calculation unit, configured to calculate transmissibility of the laser beam relative to the substrate to be inspected based on an intensity of the laser beam emitted by the laser emitting unit and an intensity of the laser beam received by the laser receiving unit, and determine whether a line width of a black matrix in the substrate to be inspected is within a predetermined range of the line width based on the transmissibility.