Abstract: The present disclosure provides an automatic focusing device, an automatic focusing electronic eyepiece and an electronic device. The automatic focusing device comprises a sensor drive unit, a master control unit and an interface unit. The master control unit is configured to control the sensor drive unit to enable the automatic focusing device to automatically focus by adjusting an image distance, the interface unit is configured to output image data of the measured target for display.

Abstract: A digital microscope and a focusing thereof are provided. The microscope integrates a focusing lens unit, a zooming lens unit and related control circuits into the interior of the microscope. The control unit executes a focus searching algorithm and focus tracking algorithm, controls movement of the focusing lens unit and the zooming lens unit and achieves auto-focus by adjusting the image distance and makes the microscope zoom by adjusting the focal length. This improves the focusing efficiency and shortens the focusing time greatly. The microscope can achieve continuous zooming and tracking by the zoom tracking algorithm and the image is kept clear in the zooming process. The microscope adjusts the brightness of the assist light source at the front end of the microscope according to the change of the amount of light transmission by the control unit executing the exposure algorithm to ensure uniform exposure.

Abstract: The present disclosure provides detection devices and methods using a diffraction wavefront of a pinhole stitching measurement of surface shape. The light emitted from the laser passes through a filter hole, a first condenser lens, a spatial filter, a beam expander, a half wave plate, a ?/4 wave plate, an attention plate and then is transmitted through a beam splitter, reflected by a reflecting mirror and is irradiated onto an pinhole through a first optical adjustable shelf and a second set of condenser lens. A part of diffraction light generated by the pinhole is irradiated to the mirror to be measured; the light reflected by the mirror to be measured is reflected by a frame of the pinhole and generate a diffraction fringe along with another part of the diffraction wavefront of the pinhole. The interference fringe is focused by the third set of condenser lens on the third optical adjustable shelf and is collected by the CCD detector.

Abstract: The present disclosure provides detection devices and methods using a diffraction wavefront of a pinhole stitching measurement of surface shape. The light emitted from the laser passes through a filter hole, a first condenser lens, a spatial filter, a beam expander, a half wave plate, a ?/4 wave plate, an attention plate and then is transmitted through a beam splitter, reflected by a reflecting mirror and is irradiated onto an pinhole through a first optical adjustable shelf and a second set of condenser lens. A part of diffraction light generated by the pinhole is irradiated to the mirror to be measured; the light reflected by the mirror to be measured is reflected by a frame of the pinhole and generate a diffraction fringe along with another part of the diffraction wavefront of the pinhole. The interference fringe is focused by the third set of condenser lens on the third optical adjustable shelf and is collected by the CCD detector.