Abstract: An optical computing topology structure configured to implement large-scale adjustment of a topology structure for different application scenarios. The optical computing topology structure includes a first physical medium, a spatial light modulator, and a second physical medium. The first physical medium, the spatial light modulator, and the second physical medium are sequentially connected. The first physical medium is configured to mix an input optical field, to implement a fully connected topology of the input optical field, to obtain a to-be-modulated optical field. The spatial light modulator is configured to modulate an optical field parameter of the to-be-modulated optical field to obtain a to-be-output optical field. The second physical medium is configured to mix the to-be-output optical field, to implement a fully connected topology of the to-be-output optical field, to obtain an output optical field.

Abstract: An optical computing device includes a control system, a light field modulation system, an optical computing system, and a light field detection system. The control system converts input data into complex amplitude-light field mapping information that is information representing an amplitude and/or a phase. The light field modulation system represents the input data based on an optical signal that is output based on the complex amplitude-light field mapping information obtained in the conversion procedure. A first computing result is generated based on the optical signal that represents the input data with high precision to complete optical computing.

Abstract: The present invention relates to the field of optical precision measurement technologies, and in particular, to a method and a device of differential confocal (confocal) and interference measurement for multiple parameters of an element. The core concept of the invention lies in that: the concurrent high-precision measurement of multiple parameters of an element may be realized by measuring the surface curvature radius of an element with spherical surface, the back focal length of a lens, the refractive index of a lens, the thickness of a lens and the axial spaces of an assembled lenses by using a differential confocal (confocal) measuring system and measuring the surface profile of the element by using a figure interference measuring system.