Patents by Inventor Jian Bal

Jian Bal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Curved conduit ion sampling device and method
    Patent number: 7423261
    Abstract: An ion sampling apparatus for use in a mass spectrometry system. The ion sampling apparatus includes a target support for receiving a sample, an irradiation source for emitting energetic radiation or particles toward the target support, and a conduit having a curved end and a longitudinal axis, the curved end having an inlet with a central axis, the conduit being adjacent to the target support. The longitudinal axis of the conduit and the central axis of the inlet intersect to define an angle that is between about 20 degrees and about 210 degrees.
    Type: Grant
    Filed: April 5, 2006
    Date of Patent: September 9, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jean-Luc Truche, Paul C. Goodley, Steven M. Fischer, Jian Bal
  • Curved conduit ion sampling device and method
    Publication number: 20070235642
    Abstract: An ion sampling apparatus for use in a mass spectrometry system. The ion sampling apparatus includes a target support for receiving a sample, an irradiation source for emitting energetic radiation or particles toward the target support, and a conduit having a curved end and a longitudinal axis, the curved end having an inlet with a central axis, the conduit being adjacent to the target support. The longitudinal axis of the conduit and the central axis of the inlet intersect to define an angle that is between about 20 degrees and about 210 degrees.
    Type: Application
    Filed: April 5, 2006
    Publication date: October 11, 2007
    Inventors: Jean-Luc Truche, Paul Goodley, Steven Fischer, Jian Bal
  • Apparatus and method for ion production enhancement
    Patent number: 7091482
    Abstract: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.
    Type: Grant
    Filed: October 15, 2004
    Date of Patent: August 15, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Jean-Luc Truche, Jian Bal
  • Apparatus and method for ion production enhancement
    Publication number: 20050072918
    Abstract: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.
    Type: Application
    Filed: October 15, 2004
    Publication date: April 7, 2005
    Inventors: Jean-Luc Truche, Jian Bal