Abstract: A manufacturing method of a chip package includes patterning a wafer to form a scribe trench, in which a light-transmissive function layer below the wafer is in the scribe trench, the light-transmissive function layer is between the wafer and a carrier, and a first included angle is formed between an outer wall surface and a surface of the wafer facing the light-transmissive function layer; cutting the light-transmissive function layer and the carrier along the scribe trench to form a chip package that includes a chip, the light-transmissive function layer, and the carrier; and patterning the chip to form an opening, in which the light-transmissive function layer is in the opening, a second included angle is formed between an inner wall surface of the chip and a surface of the chip facing the light-transmissive function layer, and is different from the first included angle.

Abstract: The invention provides a gait evaluating system and a gait evaluating method. The gait evaluation system includes a gait evaluating device configured to: obtain, from a pressure detection device, a plurality of pressure values of a user walking on the pressure detection device; obtain a plurality of step feature values of the user based on the pressure values; obtain a plurality of walking limb feature values when the user walks on the pressure detection device based on a sensing data provided by a limb sensing device; and evaluate a gait of the user based on the step feature values and the walking limb feature values.

Abstract: An exercise state evaluation method having the following steps is provided. The steps includes: obtaining a plurality of sensing signals by a foot information sensing module; recording a receiving time of each of the sensing signals by a processing unit and generating a plurality of pressure values, a plurality of center of gravity values, and a center of gravity trajectory information corresponding a human body according to each of the sensing signals; determining a start time, an acting time and a finish time corresponding to an exercise according to the receiving time, the pressure values, the center of gravity values and the center of gravity trajectory information; obtaining an act time value according to the start time, the acting time and the finish time; and integrating the pressure values, the center of gravity values, the center of gravity trajectory information and the act time value to an user interface.

Abstract: An oxidizing gas detection method and an apparatus thereof are provided for trace oxidizing gas detection. The detection method includes the following steps. First, perform an electroreduction reaction and a photoreduction reaction simultaneously to a metal oxide in which nanoconductors are distributed. Next, stop the electroreduction reaction and the photoreduction reaction, and read a resistance of the reduced metal oxide by applying a first pulse-width modulation signal. Next, provide an oxidizing gas to the reduced metal oxide, and photo-catalyze a redox reaction between the oxidizing gas and the reduced metal oxide. Next, read a resistance of the oxidized metal oxide by applying a second pulse-width modulation signal. Next, converse a concentration of the oxidizing gas according to a ratio of the resistance of the oxidized metal oxide and the resistance of the reduced metal oxide.

Abstract: An exercise state evaluation method having the following steps is provided. The steps includes: obtaining a plurality of sensing signals by a foot information sensing module; recording a receiving time of each of the sensing signals by a processing unit and generating a plurality of pressure values, a plurality of center of gravity values, and a center of gravity trajectory information corresponding a human body according to each of the sensing signals; determining a start time, an acting time and a finish time corresponding to an exercise according to the receiving time, the pressure values, the center of gravity values and the center of gravity trajectory information; obtaining an act time value according to the start time, the acting time and the finish time; and integrating the pressure values, the center of gravity values, the center of gravity trajectory information and the act time value to an user interface.

Abstract: A method for processing a plurality of semiconductor wafers includes acquiring a process parameter measurement for each of the semiconductor wafers, associating each of the semiconductor wafers with one of a plurality of groups based on a respective process parameter measurement for each of the semiconductor wafers, where each respective group corresponds to a respective recipe, and for each one of the groups, processing ones of the semiconductor wafers associated with that group together according to a respective recipe.

Abstract: An oxidizing gas detection method and an apparatus thereof are provided for trace oxidizing gas detection. The detection method includes the following steps. First, perform an electroreduction reaction and a photoreduction reaction simultaneously to a metal oxide in which nanoconductors are distributed. Next, stop the electroreduction reaction and the photoreduction reaction, and read a resistance of the reduced metal oxide by applying a first pulse-width modulation signal. Next, provide an oxidizing gas to the reduced metal oxide, and photo-catalyze a redox reaction between the oxidizing gas and the reduced metal oxide. Next, read a resistance of the oxidized metal oxide by applying a second pulse-width modulation signal. Next, converse a concentration of the oxidizing gas according to a ratio of the resistance of the oxidized metal oxide and the resistance of the reduced metal oxide.

Abstract: A non-destructive and optical measurement automation system for web thickness of microdrills and method thereof can obtain the measuring data corresponding to a certain section to be measured of a microdrill by means of automated optical measurement. Specifically speaking, the said system and method measure the section to be measured via an optical measuring plane formed by a measuring light beam, and the included angle between the optical measuring plane and the central axis of the microdrill is practically consistent with the helix angle of the microdrill. The said system and method then analyze the measuring data via a computer device to obtain the outer diameter and the depths of helical flutes corresponding to the section to be measured. Finally, the said system and method calculate the web thickness of the said section to be measured according to the outer diameter and the depths of helical flutes.

Abstract: A non-destructive and optical measurement automation system for web thickness of microdrills and method thereof can obtain the measuring data corresponding to a certain section to be measured of a microdrill by means of automated optical measurement. Specifically speaking, the said system and method measure the section to be measured via an optical measuring plane formed by a measuring light beam, and the included angle between the optical measuring plane and the central axis of the microdrill is practically consistent with the helix angle of the microdrill. The said system and method then analyze the measuring data via a computer device to obtain the outer diameter and the depths of helical flutes corresponding to the section to be measured. Finally, the said system and method calculate the web thickness of the said section to be measured according to the outer diameter and the depths of helical flutes.

Abstract: A heating pump includes a motor, a housing fixed to the motor, an impeller driven by the motor and received in the housing, and a tubular heating member fixed in the housing. The housing includes an intake tube and a discharge port arranged at the periphery of the intake tube. The impeller includes an inlet communicating with the intake tube and a plurality of outlets around the inlet. The outlets communicate with the discharge port via a first passage surrounded by the heating member. A second passage, which communicates with the first passage, is formed between a radially outer surface of the heating member and a radially inner surface of the housing.

Abstract: A method of manufacturing suspension devices comprising the steps of: a) forming an integral elastic sheet, the elastic sheet having first and second suspension devices, each suspension device being provided with attachment parts configured to be fixed to a movable object, fixing parts configured to be fixed to a base, and elastic parts connected between the attachment parts and the fixing parts respectively and configured to bias the object relative to the base, the elastic parts of the suspension devices being alternately distributed; b) separating the first and second suspension devices from each other before being attached to the object.

Abstract: A method for processing a plurality of semiconductor wafers includes acquiring a process parameter measurement for each of the semiconductor wafers, associating each of the semiconductor wafers with one of a plurality of groups based on a respective process parameter measurement for each of the semiconductor wafers, where each respective group corresponds to a respective recipe, and for each one of the groups, processing ones of the semiconductor wafers associated with that group together according to a respective recipe.

Abstract: A method of manufacturing suspension devices comprising the steps of: a) forming an integral elastic sheet, the elastic sheet having first and second suspension devices, each suspension device being provided with attachment parts configured to be fixed to a movable object, fixing parts configured to be fixed to a base, and elastic parts connected between the attachment parts and the fixing parts respectively and configured to bias the object relative to the base, the elastic parts of the suspension devices being alternately distributed; b) separating the first and second suspension devices from each other before being attached to the object.