Patents by Inventor Jianbin Fu

Jianbin Fu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190013871
    Abstract: An apparatus comprises a phase modulator having a first input port to receive a radiation and having a first output port to provide a first signal toward a device under test (DUT), wherein the phase modulator is configured to generate the first signal by performing phase modulation on the radiation received at the first input port; an intensity modulator having a second input port to receive the radiation and having a second output port to provide a second signal toward the DUT, wherein the intensity modulator is configured to generate the second signal by performing intensity modulation on the radiation received at the second input port; and a transfer function analyzer configured to determine a transfer function of the DUT based on the first signal and the second signal.
    Type: Application
    Filed: July 5, 2017
    Publication date: January 10, 2019
    Inventors: Shilong Pan, Min Xue, Shifeng Liu, Shupeng Li, Jianbin Fu, Wansheng Pan
  • Patent number: 10171174
    Abstract: An apparatus comprises a phase modulator having a first input port to receive a radiation and having a first output port to provide a first signal toward a device under test (DUT), wherein the phase modulator is configured to generate the first signal by performing phase modulation on the radiation received at the first input port; an intensity modulator having a second input port to receive the radiation and having a second output port to provide a second signal toward the DUT, wherein the intensity modulator is configured to generate the second signal by performing intensity modulation on the radiation received at the second input port; and a transfer function analyzer configured to determine a transfer function of the DUT based on the first signal and the second signal.
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: January 1, 2019
    Assignee: SUZHOU LIUYAOSI INFORMATION TECHNOLOGY CO., LTD.
    Inventors: Shilong Pan, Min Xue, Shifeng Liu, Shupeng Li, Jianbin Fu, Wansheng Pan
  • Publication number: 20080286742
    Abstract: A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
    Type: Application
    Filed: July 9, 2008
    Publication date: November 20, 2008
    Inventors: Daniel Bolt, Jianbin Fu
  • Patent number: 7418458
    Abstract: A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
    Type: Grant
    Filed: April 6, 2005
    Date of Patent: August 26, 2008
    Assignee: Educational Testing Service
    Inventors: Daniel Bolt, Jianbin Fu
  • Publication number: 20050222799
    Abstract: A method and system for determining attribute score levels from an assessment are disclosed. An assessment includes items each testing for at least one attribute. A first distribution is generated having a response propensity represented by a highest level of execution for each attribute tested by the item. An item threshold is determined for at least one score for the first distribution. Each item threshold corresponds to a level of execution corresponding to the score for which the item threshold is determined. For each attribute tested by the item, a second distribution is generated having a response propensity represented by a lowest level of execution for the attribute and the highest level of execution for all other attributes tested by the item. A mean parameter is determined for the second distribution. An attribute score level is determined for the scores based on the item thresholds and the mean parameters.
    Type: Application
    Filed: April 6, 2005
    Publication date: October 6, 2005
    Inventors: Daniel Bolt, Jianbin Fu