Patents by Inventor Jiang Xiang

Jiang Xiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Interferometric apparatus and sample characteristic determining apparatus using such apparatus
    Patent number: 9945655
    Abstract: An interferometer apparatus comprising: a short coherence length or broadband light source; a light director to direct light from the light source along a measurement path to a surface of a sample and also along a reference path to a reference surface; a wavelength disperser to cause wavelength dispersion of light along one of the measurement and the reference paths; a combiner to cause light from the sample surface and light from the reference surface to produce an interference pattern or interferogram; a detect—or to detect intensity values of the interference pattern as a function of wavelength; and a determiner to determine from the detected intensity values the wavelength at which the measurement and reference paths are balanced, wherein the wavelength disperser is at least one of: a grating wavelength disperser, a prism wavelength disperser, and an optical dispersive medium.
    Type: Grant
    Filed: December 12, 2013
    Date of Patent: April 17, 2018
    Assignee: University of Huddersfield
    Inventors: Jiang Xiang, Haydn Martin
  • INTERFEROMETRIC APPARATUS AND SAMPLE CHARACTERISTIC DETERMINING APPARATUS USING SUCH APPARATUS
    Publication number: 20150338202
    Abstract: An interferometer apparatus comprising: a short coherence length or broadband light source; a light director to direct light from the light source along a measurement path to a surface of a sample and also along a reference path to a reference surface; a wavelength disperser to cause wavelength dispersion of light along one of the measurement and the reference paths; a combiner to cause light from the sample surface and light from the reference surface to produce an interference pattern or interferogram; a detect—or to detect intensity values of the interference pattern as a function of wavelength; and a determiner to determine from the detected intensity values the wavelength at which the measurement and reference paths are balanced, wherein the wavelength disperser is at least one of: a grating wavelength disperser, a prism wavelength disperser, and an optical dispersive medium.
    Type: Application
    Filed: December 12, 2013
    Publication date: November 26, 2015
    Applicant: UNIVERSITY OF HUDDERSFIELD
    Inventors: Jiang Xiang, Martin Haydn