Abstract: Embodiments of the invention provide a microscope lens, which comprises an eye lens end and an objective lens end, wherein a central axis of the eye lens end intersects a central axis of the objective lens end, and the microscope lens further comprises a reflector disposed between the eye lens end and the objective lens end, such that light from one of the eye lens end and the objective lens end is reflected by the reflector before exiting from the other of the eye lens end and the objective lens end. Embodiments of the invention also provide a microscope system comprising the above microscope lens. With the microscope lens and the microscope system provided in this disclosure, observation and identification of the defect(s) on the observed object (for example, a glass substrate) may be improved, and accuracy of statistic of product yield can thereby be increased.