Abstract: A method of recommending an object, an electronic device, and a storage medium are provided. The method includes: determining, in response to receiving target user behavior data of a target user from a target client, a target object according to the target user behavior data and at least one candidate user behavior data corresponding to a plurality of candidate users; and sending the target object to the target client, so as to recommend the target object to the target user, where each of the candidate user behavior data is stored in a predetermined block chain, each of the candidate user behavior data corresponds to at least one of a plurality of block chain nodes contained in a block chain network, and each of the candidate user behavior data indicates a preference of a candidate user for at least one candidate object.

Abstract: A display panel includes a substrate, an active layer, a first metal layer and a second metal layer. The active layer is disposed on the substrate and includes a plurality of the driving active portions, and each driving active portion comprises a conductor sub-layer and a first semiconductor sub-layer. The first metal layer is disposed on a side of the active layer away from the substrate and includes a plurality of the driving gates, one of the plurality of the driving gates is correspondingly located on a side of the driving active portion away from the substrate. The second metal layer disposed on a side of the first metal layer away from the active layer and includes a plurality of the driving source electrodes and a plurality of the driving drain electrodes. The conductor sub-layer includes a first conductor sub-portion and a second conductor sub-portion arranged at intervals.

Abstract: The present invention discloses a micro light emitting diode display substrate and a manufacturing method thereof. The substrate includes an underlay substrate, a thin film transistor and a micro light emitting diode disposed on a top surface of the underlay substrate and connected to each other, a first metal film layer disposed on a bottom surface of the underlay substrate and at least formed with fanout circuit pattern and a side printed bonding pad. The fanout circuit pattern is connected to the side printed bonding pad, the side printed bonding pad is connected to the thin film transistor through a side wire such that after the display substrate is assembled with a bezel, a top surface display pixel region can maximally approach the bezel, to achieve bezel-less effect.

Abstract: A data index establishment method obtains M raw data segments and a first-layer mapping relationship through segment fitting on raw data in a raw data table, and further obtains N first key segments and a second-layer mapping relationship through segment fitting on a first key of each raw data segment. In a subsequent data query process, a multi-layer mapping relationship is input from a to-be-queried key sequentially in descending order, until a location of the to-be-queried key in the raw data table is located.

Abstract: A data index establishment method obtains M raw data segments and a first-layer mapping relationship through segment fitting on raw data in a raw data table, and further obtains N first key segments and a second-layer mapping relationship through segment fitting on a first key of each raw data segment. In a subsequent data query process, a multi-layer mapping relationship is input from a to-be-queried key sequentially in descending order, until a location of the to-be-queried key in the raw data table is located.

Abstract: A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.

Abstract: A method for imaging a sample using a high speed dynamic mode atomic force microscope may include scanning a tip of a cantilever probe over a surface of the sample, regulating a vibration amplitude of the tip to remain constant at a set point value (Aset), via a first signal generated in a first feedback controller, measuring a mean tapping deflection of the tip, regulating the mean tapping deflection via a second signal generated in a second feedback controller, tracking and measuring an adjustment to the measured mean tapping deflection during the regulating. The method may further include generating an image topography of the sample based on the first signal, the second signal, and the measured adjustment of the mean tapping deflection of the cantilever probe.