Abstract: Apparatus for measuring the surface profile of a sample, includes a fixture for locating a surface of a transparent optical flat relative to a surface of a sample; a low-coherence light interferometer having an optical probe coupled to an XY scanning frame for scanning the surface of the sample through the transparent optical flat to produce interferometric data signals representing the distances between the optical flat surface and the surface of the sample; and a computer system responsive to the interferometric data signals for generating a surface profile of the sample using a best fit to a plane.

Abstract: Apparatus for measuring the surface profile of a sample, includes a fixture for locating a surface of a transparent optical flat relative to a surface of a sample; a low-coherence light interferometer having an optical probe coupled to an XY scanning frame for scanning the surface of the sample through the transparent optical flat to produce interferometric data signals representing the distances between the optical flat surface and the surface of the sample; and a computer system responsive to the interferometric data signals for generating a surface profile of the sample using a best fit to a plane.

Abstract: An interferometric-based measurement system for externally measuring a distance between a pair of reference surfaces on an object, including: a low coherence light interferometer; an object mounting apparatus including an optical probe having an optical probe chuck; an optical fiber cable for coupling light from the interferometer to the optical probe chuck; and a computer for processing data collected by the interferometer, wherein the data is used to determine the distance between the pair of reference surfaces on the object.

Abstract: A method of simultaneously measuring the thickness, group index of refraction, and top and bottom surface profiles of a sample, includes the steps of locating the sample between a surface of a transparent optical flat and a parallel reflective surface such that the respective optical distances between any two of the surface of the optical flat, the top surface of the sample, the bottom surface of the sample, and the reflective surface are distinct and in a known relative optical distance relationship, the distance between the surface of the transparent optical flat and the parallel reflective surface being known.

Abstract: A method for determining whether an imager assembly outside of a camera body meets predetermined focus specifications, wherein the imager assembly includes an image sensor and a camera mounting plate having reference features adapted to cooperate with alignment features in the camera body to locate the image sensor at a predetermined focal plane, including the steps of: mounting the imager assembly onto an imager mounting apparatus having equivalent alignment features; and utilizing low-coherence light interferometry to determine whether the image sensor will meet predetermined focus specifications when mounted in a camera body.

Abstract: A method for determining whether an imager assembly outside of a camera body meets predetermined focus specifications, wherein the imager assembly includes an image sensor and a camera mounting plate having reference features adapted to cooperate with alignment features in the camera body to locate the image sensor at a predetermined focal plane, including the steps of: mounting the imager assembly onto an imager mounting apparatus having equivalent alignment features; and utilizing low-coherence light interferometry to determine whether the image sensor will meet predetermined focus specifications when mounted in a camera body.

Abstract: An interferometric-based measurement system for externally measuring a distance between a pair of reference surfaces on an object, including: a low coherence light interferometer; an object mounting apparatus including an optical probe having an optical probe chuck; an optical fiber cable for coupling light from the interferometer to the optical probe chuck; and a computer for processing data collected by the interferometer, wherein the data is used to determine the distance between the pair of reference surfaces on the object.

Abstract: A method for determining whether an imager assembly outside of a camera body meets predetermined focus specifications, wherein the imager assembly includes an image sensor and a camera mounting plate having reference features adapted to cooperate with alignment features in the camera body to locate the image sensor at a predetermined focal plane, including the steps of: mounting the imager assembly onto an imager mounting apparatus having equivalent alignment features; and utilizing low-coherence light interferometry to determine whether the image sensor will meet predetermined focus specifications when mounted in a camera body.

Abstract: A method for determining whether an imager assembly outside of a camera body meets predetermined focus specifications, wherein the imager assembly includes an image sensor and a camera mounting plate having reference features adapted to cooperate with alignment features in the camera body to locate the image sensor at a predetermined focal plane, including the steps of: mounting the imager assembly onto an imager mounting apparatus having equivalent alignment features; and utilizing low-coherence light interferometry to determine whether the image sensor will meet predetermined focus specifications when mounted in a camera body.

Abstract: A method of processing interferometric data relating to a sample having multiple reflective surfaces, includes the steps of: specifying a set of acceptance ranges for peaks of interest in the interferogram, based on a knowledge of the sample; determining which peaks in the interferogram fall within the acceptance ranges; identifying which peaks within the acceptance ranges represent multiple reflections and eliminating these peaks from the interferometric data; identifying acceptance ranges which do not contain peaks; and employing other peaks in the interferogram to calculate the locations of peaks in the acceptance ranges that do not contain peaks.

Abstract: A method for determining whether an imager assembly outside of a camera body meets predetermined focus specifications, wherein the imager assembly includes an image sensor and a camera mounting plate having reference features adapted to cooperate with alignment features in the camera body to locate the image sensor at a predetermined focal plane, including the steps of: mounting the imager assembly onto an imager mounting apparatus having equivalent alignment features; and utilizing low-coherence light interferometry to determine whether the image sensor will meet predetermined focus specifications when mounted in a camera body.

Abstract: An apparatus for determining a thickness profile of a moving material having at least two optical interfaces. A transport apparatus transports a length of moving material at a predetermined flatness through a measurement region. A recessed track disposed in the channel provides an area of non-contact in the measurement region. An interferometer apparatus collects a portion of a beam of light reflected from the optical interfaces of the moving length and generates an interference signal representative of the collected light. An analyzer then analyzes the interference signal to determine a thickness profile of the material in the first direction.

Abstract: A method for determining a thickness of a moving material having at least two optical interfaces. A length of material is transported along a transport path through a measurement region, and is maintained at a substantially constant velocity and a predetermined flatness. A beam of light is directed toward the moving length disposed within the measurement region, and a portion of the light reflected from the optical interfaces of the moving length is collected and directed toward an interferometer apparatus. The interferometer apparatus generates an interference signal representative of the collected light and analyzes a plurality of the interference signals to determine a thickness profile of the material in the first direction.

Abstract: A method for determining the optical retardation of an anisotropic material. A beam of light is directed toward a sample of the material and a portion of the reflected beam is collected from the optical interfaces of the material and directed toward an interferometer. The resulting interference signal is analyzed to determine the retardation. The retardation is determined as being the distance between particular peaks of the interference signal. In a further embodiment, light from multiple wavelength light sources is directed toward the sample of the material.

Abstract: A method for processing interferometric measurement data representative of a physical property of an object, such as the thickness of material M. A plurality of interference signals are acquired and stored with respect to a length L, and a dimension of length L over which the plurality of interference signals were acquired is determined. A location of all peaks of the interference signals is then determined with respect to a start position of the acquisition of the plurality of interference signals. The interferometer peaks which are representative of the physical property of the object are then determined and stored.

Abstract: An optical probe apparatus and method for determining a position of an image sensor within a digital camera relative to a reference surface. The apparatus includes an optical probe assembly removably mountable to the digital camera. A non-coherent light interferometer in communication with the optical probe assembly is utilized to determine a depth from a reference surface to the image sensor and optical probe assembly.