Patents by Inventor Jianxi Ding

Jianxi Ding has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect identification method, and array detection probe
    Patent number: 12196710
    Abstract: Provided are an alternating current field based defect identification method and an array detection probe. The evaluation method includes the following steps: obtaining a magnetic field Bx signal in direction X and a magnetic field Bz signal in direction Z; removing a background magnetic field of each of the magnetic field Bx signal in the direction X and the magnetic field Bz signal in the direction Z, and obtaining a magnetic field Bx1 signal in the direction X and a magnetic field Bz1 signal in the direction Z without background magnetic fields; drawing an array image of the Bx1 signal and an array image of the Bz1 signal; and locating a distortion zone corresponding to disturbance at the same time and position in the array image of the Bx1 signal and the array image of the Bz1 signal.
    Type: Grant
    Filed: May 14, 2024
    Date of Patent: January 14, 2025
    Assignee: CHINA UNIVERSITY OF PETROLEUM (EAST CHINA)
    Inventors: Wei Li, Xin'an Yuan, Xiaokang Yin, Jianming Zhao, Xiao Li, Jianchao Zhao, Jianxi Ding, Han Wang, Qinyu Chen, Dong Hu, Wenbin Wang, Xihe Zhang, Xiangyang Wang