Abstract: A non-contact probe signal loading device is disclosed. The non-contact probe signal loading device includes a probe metal sheet electrically connected to a signal loading terminal, a lower surface of the probe metal sheet facing towards a signal inputting metal sheet into which a signal is to be loaded. A signal transmitting capacitor is formed between the probe metal sheet and the signal inputting metal sheet, and the signal transmitting capacitor functions as a medium to transmit a loaded signal to the signal inputting metal sheet from the probe metal sheet.

Abstract: A non-contact probe signal loading device is disclosed. The non-contact probe signal loading device includes a probe metal sheet electrically connected to a signal loading terminal, a lower surface of the probe metal sheet facing towards a signal inputting metal sheet into which a signal is to be loaded, wherein a signal transmitting capacitor is formed between the probe metal sheet and the signal inputting metal sheet, and the signal transmitting capacitor functions as a medium to transmit a loaded signal to the signal inputting metal sheet from the probe metal sheet.

Abstract: A testing probe and a testing apparatus are disclosed. The testing probe including: a housing, including a test end and a fixed end, and with a test opening at the test end; a piston, being capable of sliding between the test end and the fixed end along an inner wall of the housing, and a conductive adhesive agent chamber being formed by the piston and the fixed end of the housing and being configured to be filled with a conductive adhesive agent; and the conductive adhesive agent being allowed to overflow from a gap between the piston and the inner wall of the housing by squeezing the piston; an elastic member with a first end fixed to the piston and a second end extending toward the test end; a sphere being disposed at the test opening and separated from the second end of the elastic member by a preset distance.

Abstract: A testing probe and a testing apparatus are disclosed. The testing probe including: a housing, including a test end and a fixed end, and with a test opening at the test end; a piston, being capable of sliding between the test end and the fixed end along an inner wall of the housing, and a conductive adhesive agent chamber being formed by the piston and the fixed end of the housing and being configured to be filled with a conductive adhesive agent; and the conductive adhesive agent being allowed to overflow from a gap between the piston and the inner wall of the housing by squeezing the piston; an elastic member with a first end fixed to the piston and a second end extending toward the test end; a sphere being disposed at the test opening and separated from the second end of the elastic member by a preset distance.

Abstract: A harmonic protection method for a capacitor bank uses a harmonic protection apparatus, which includes a CPU unit, a current and voltage sampling unit, and a protection device. The CPU unit obtains effective value I1 of fundamental wave current of the capacitor bank, and effective value In of the n-th harmonic wave current of the capacitor bank, where n is harmonic order and ranges from 2 to ?, and calculates the true effective value I of current of the capacitor bank by I = I 1 2 + ? n = 2 ? ? k n ? I n 2 provided that kn=rn/r1, kn is the n-th harmonic coefficient, rn is power consumption equivalent resistance of the capacitor bank for the n-th harmonic, r1 is power consumption equivalent resistance of the capacitor bank at a fundamental frequency. When I?1.3 IN, the CPU unit controls the protecting device to disconnect the capacitor bank, provided that IN is a threshold current of the capacitor bank.

Abstract: A harmonic protection method for a capacitor bank uses a harmonic protection apparatus, which includes a CPU unit, a current and voltage sampling unit, and a protection device. The CPU unit obtains effective value I1 of fundamental wave current of the capacitor bank, and effective value In of the n-th harmonic wave current of the capacitor bank, where n is harmonic order and ranges from 2 to ?, and calculates the true effective value I of current of the capacitor bank by I = I 1 2 + ? n = 2 ? ? k n ? I n 2 provided that kn=rn/r1, kn is the n-th harmonic coefficient , rn is power consumption equivalent resistance of the capacitor bank for the n-th harmonic, r1 is power consumption equivalent resistance of the capacitor bank at a fundamental frequency. When I?1.3 IN, the CPU unit controls the protecting device to disconnect the capacitor bank, provided that IN is a threshold current of the capacitor bank.