Abstract: The present disclosure provides methods for testing and evaluating electrical parameters of electronic circuits. An exemplary method includes providing a device-under-test electrically coupled to a testing apparatus; and determining an optimum value of a first electrical parameter and an optimum value of a second parameter by testing the device-under-test according to a set of first electrical parameter values and a set of second electrical parameter values. The optimum value of the first electrical parameter and the optimum value of the second parameter are determined based on an electrical noise response of the device-under-test.

Abstract: Implementations disclosed herein provide for a third-party application an ability to access a first-party notification interface without receiving credentials linked to a first-party user account. In addition, a device-level permission is established such that each third-party application operating on a client device does not need to seek permission to access the notification interface. A third-party application may request an access code from a client device. The access code may be presented to an authentication server. The authentication server may provide an access token and a refresh token to the third-party application. The third party application may provide the access token and data to be included in a notification to the first-party notification interface.

Abstract: The present application relates to the field of charging electrical apparatuses, and more particularly, to a charging authorization approach for objects to be recharged, an automatic authorization approach and system for charging apparatuses. The present application intends to solve the problem of complicate authentication procedure and poor user experience when a charging apparatus authenticates an electric vehicle in the prior art.

Abstract: A device is disclosed that includes a delay circuit, a detection circuit, and a bias circuit. The delay circuit is configured to generate an oscillating signal in response to a reference signal, a first bias voltage, and a second bias voltage. The detection circuit is configured to compare the oscillating signal with the reference signal, to generate a detect signal. The bias circuit is configured to adjust the first bias voltage and the second bias voltage according to the detect signal and a reference voltage.

Abstract: A device is disclosed that includes a delay circuit, a detection circuit, and a bias circuit. The delay circuit is configured to generate an oscillating signal in response to a reference signal, a first bias voltage, and a second bias voltage. The detection circuit is configured to compare the oscillating signal with the reference signal, to generate a detect signal. The bias circuit is configured to adjust the first bias voltage and the second bias voltage according to the detect signal and a reference voltage.

Abstract: The present disclosure provides methods for testing and evaluating electrical parameters of electronic circuits. An exemplary method includes providing a device-under-test electrically coupled to a testing apparatus; and determining an optimum value of a first electrical parameter and an optimum value of a second parameter by testing the device-under-test according to a set of first electrical parameter values and a set of second electrical parameter values. The optimum value of the first electrical parameter and the optimum value of the second parameter are determined based on an electrical noise response of the device-under-test.

Abstract: The present disclosure provides a method for testing a semiconductor device. The method includes providing a test unit and an electronic circuit that is electrically coupled to the test unit. The method includes performing a multi-dimensional sweeping process. The multi-dimensional sweeping process includes sweeping a plurality of different electrical parameters across their respective ranges. The method includes monitoring a performance of the electronic circuit during the multi-dimensional sweeping process. The monitoring includes identifying optimum values of the different electrical parameters that yield a satisfactory performance of the electronic circuit. The method includes testing the test unit using the optimum values of the different electrical parameters.

Abstract: Systems, methods, and computer storage mediums are provided for correcting the placement of an object on an image. An example method includes providing the image and depth data that describes the depth of the three-dimensional scene captured by the image. The depth data describes at least a distance between a camera that captured the three-dimensional scene and one or more structures in the scene and a geolocation of the camera when the three-dimensional scene was captured. When the object is moved from a first location on the image to a second location on the image, a set of coordinates that describes the second location relative to the image is received. The set of coordinates are then translated into geolocated coordinates that describe a geolocation that corresponds to the second location. The set of coordinate is translated, at least in part, using the depth data associated with the image.

Abstract: Provided is an apparatus for testing a semiconductor device. The apparatus includes a plurality of testing pads. The apparatus includes a plurality of testing units. The apparatus includes a switching circuit coupled between the testing pads and the testing units. The switching circuit contains a plurality of switching devices. The apparatus includes a control circuit coupled to the switching circuit. The control circuit is operable to establish electrical coupling between a selected testing unit and one or more of the testing pads by selectively activating a subset of the switching devices.

Abstract: A computing system is described that determines, based on a location history, a content-viewing location associated with a user of a mobile computing device and identifies a media output device located at the content-viewing location. Responsive to determining that the mobile computing device is located at the content-viewing location and in proximity to the media output device at a current time, the computing system determines, based on a plurality of features of the media output device, various media recommendations for the user at the current time. The plurality of features include an indication of whether the media output device is operating in an on state at the current time. The computing system outputs, for transmission to the mobile computing device, an indication of the various media recommendations.

Abstract: The present disclosure provides a method for testing a semiconductor device. The method includes providing a testing unit and an electronic circuit coupled to the testing unit and applying a first electrical signal to the testing unit. The method includes sweeping a second electrical signal across a range of values, the second electrical signal supplying power to the electronic circuit, wherein the sweeping is performed while a value of the first electrical signal remains the same. The method includes measuring a third electrical signal during the sweeping, the measured third electrical signal having a range of values that each correspond to one of the values of the second electrical signal. The method includes adopting an optimum value of the second electrical signal that yields a minimum value of the third electrical signal. The method includes testing the testing unit while the second electrical signal is set to the optimum value.

Abstract: Systems, methods, and computer storage mediums are provided for correcting the placement of an object on an image. An example method includes providing the image and depth data that describes the depth of the three-dimensional scene captured by the image. The depth data describes at least a distance between a camera that captured the three-dimensional scene and one or more structures in the scene and a geolocation of the camera when the three-dimensional scene was captured. When the object is moved from a first location on the image to a second location on the image, a set of coordinates that describes the second location relative to the image is received. The set of coordinates are then translated into geolocated coordinates that describe a geolocation that corresponds to the second location. The set of coordinate is translated, at least in part, using the depth data associated with the image.

Abstract: The present disclosure provides a method for testing a semiconductor device. The method includes providing a testing unit and an electronic circuit coupled to the testing unit and applying a first electrical signal to the testing unit. The method includes sweeping a second electrical signal across a range of values, the second electrical signal supplying power to the electronic circuit, wherein the sweeping is performed while a value of the first electrical signal remains the same. The method includes measuring a third electrical signal during the sweeping, the measured third electrical signal having a range of values that each correspond to one of the values of the second electrical signal. The method includes adopting an optimum value of the second electrical signal that yields a minimum value of the third electrical signal. The method includes testing the testing unit while the second electrical signal is set to the optimum value.

Abstract: The present disclosure provides a method for testing a semiconductor device. The method includes providing a testing unit and an electronic circuit coupled to the testing unit and applying a first electrical signal to the testing unit. The method includes sweeping a second electrical signal across a range of values, the second electrical signal supplying power to the electronic circuit, wherein the sweeping is performed while a value of the first electrical signal remains the same. The method includes measuring a third electrical signal during the sweeping, the measured third electrical signal having a range of values that each correspond to one of the values of the second electrical signal. The method includes adopting an optimum value of the second electrical signal that yields a minimum value of the third electrical signal. The method includes testing the testing unit while the second electrical signal is set to the optimum value.

Abstract: Embodiments of the present invention enable displaying a plurality of driving direction steps that form a driving directions path between a start address and a destination address; receiving input selecting a driving direction step of said plurality of driving direction steps; and displaying a panoramic image of a geographic area where a driving action associated with said selected driving direction step would be performed by a driver. In other embodiments, the panoramic image is replaced and/or complemented with one or more of 3D models, full-motion video, full-motion video of 360 degrees images, and live feeds from video cameras to provide enhanced driving directions.

Abstract: The present disclosure provides a method for testing a semiconductor device. The method includes providing a test unit and an electronic circuit that is electrically coupled to the test unit. The method includes performing a multi-dimensional sweeping process. The multi-dimensional sweeping process includes sweeping a plurality of different electrical parameters across their respective ranges. The method includes monitoring a performance of the electronic circuit during the multi-dimensional sweeping process. The monitoring includes identifying optimum values of the different electrical parameters that yield a satisfactory performance of the electronic circuit. The method includes testing the test unit using the optimum values of the different electrical parameters.

Abstract: The present disclosure provides an apparatus testing a semiconductor device. The apparatus includes a plurality of testing pads. The apparatus includes a plurality of testing units. The apparatus includes a switching circuit coupled between the testing pads and the testing units. The switching circuit contains a plurality of switching devices. The apparatus includes a control circuit coupled to the switching circuit. The control circuit is operable to establish electrical coupling between a selected testing unit and one or more of the testing pads by selectively activating a subset of the switching devices.

Abstract: The present disclosure provides a method for testing a semiconductor device. The method includes providing a testing unit and an electronic circuit coupled to the testing unit and applying a first electrical signal to the testing unit. The method includes sweeping a second electrical signal across a range of values, the second electrical signal supplying power to the electronic circuit, wherein the sweeping is performed while a value of the first electrical signal remains the same. The method includes measuring a third electrical signal during the sweeping, the measured third electrical signal having a range of values that each correspond to one of the values of the second electrical signal. The method includes adopting an optimum value of the second electrical signal that yields a minimum value of the third electrical signal. The method includes testing the testing unit while the second electrical signal is set to the optimum value.

Abstract: The present invention is directed to a method for populating a database with a set of images of an anatomical structure. The database is used to perform appearance matching in image pairs of the anatomical structure. A set of image pairs of anatomical structures is received, where each image pair is annotated with a plurality of location-sensitive regions that identify a particular aspect of the anatomical structure. Weak learners are iteratively selected and an image patch is identified. A boosting process is used to identify a strong classifier based on responses to the weak learners applied to the identified image patch for each image pair. The responses comprise a feature response and a location response associated with the image patch. Positive and negative image pairs are generated. The positive and negative image pairs are used to learn a similarity function. The learned similarity function and iteratively selected weak learners are stored in the database.

Abstract: A method for generating Pairwise Active Appearance Models (PAAMs) that characterize shape, appearance and motion of an object and using the PAAM to track the motion of an object is disclosed. A plurality of video streams is received. Each video stream includes a series of image frames that depict an object in motion. Each video stream includes an index of identified motion phases that are associated with a motion cycle of the object. For each video stream, a shape of the object is represented by a shape vector. An appearance of an object is represented by an appearance vector. The shape and appearance vectors associated at two consecutive motion phases are concatenated. Paired data for the concatenated shape and appearance vectors is computed. Paired data is computed for each two consecutive motion phases in the motion cycle. A shape subspace is constructed based on the computed paired data. An appearance subspace is constructed based on the computed paired data.