Patents by Inventor Jie-Wei Huang

Jie-Wei Huang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test system
    Patent number: 8037089
    Abstract: A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control signals and determining a plurality of test results for the devices under test according to a plurality of measurement results. Each processor coupled to the tester is used for generating a plurality of test signals according to the plurality of control signals. The plurality of devices under test respectively generates the plurality of test results according to the plurality of test signals.
    Type: Grant
    Filed: October 29, 2008
    Date of Patent: October 11, 2011
    Assignee: Princeton Technology Corporation
    Inventors: Cheng-Yung Teng, Yi-Chang Hsu, Jie-Wei Huang
  • Circuit testing apparatus
    Patent number: 7706999
    Abstract: The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.
    Type: Grant
    Filed: May 31, 2007
    Date of Patent: April 27, 2010
    Assignee: Princeton Technology Corporation
    Inventors: Cheng-Yung Teng, Li-Jieu Hsu, Jie-Wei Huang, Huei-Huang Chen
  • TEST SYSTEM
    Publication number: 20090113260
    Abstract: A test system for testing a plurality of devices under test is disclosed. The test system includes a tester and a plurality of processors. The tester is used for providing a plurality of control signals and determining a plurality of test results for the devices under test according to a plurality of measurement results. Each processor coupled to the tester is used for generating a plurality of test signals according to the plurality of control signals. The plurality of devices under test respectively generates the plurality of test results according to the plurality of test signals.
    Type: Application
    Filed: October 29, 2008
    Publication date: April 30, 2009
    Inventors: Cheng-Yung TENG, Yi-Chang HSU, Jie-Wei HUANG
  • Circuit testing apparatus
    Publication number: 20080243409
    Abstract: The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.
    Type: Application
    Filed: May 31, 2007
    Publication date: October 2, 2008
    Inventors: Cheng-Yung Teng, Li-Jieu Hsu, Jie-Wei Huang, Huei-Huang Chen