Patents by Inventor Jim Boyd Curtis

Jim Boyd Curtis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7663757
    Abstract: A method for obtaining a reflectance property indication of a sample which includes making a reflectance measurement of the sample and correcting the reflectance measurement in order to obtain the reflectance property indication. The reflectance measurement represents an observed reflectance of the sample, the reflectance property indication represents a standardized reflectance of the sample, and correcting the reflectance measurement accounts for a difference between the standardized reflectance and the observed reflectance. An apparatus for making a reflectance measurement of a sample which includes a housing defining a viewing port, a temperature control mechanism for controlling the temperature within the interior of the housing, and an optical reflectometer contained within the interior of the housing. The reflectometer has a measurement direction and is movable within the housing so that the measurement direction can be selectively aligned with the viewing port.
    Type: Grant
    Filed: September 27, 2006
    Date of Patent: February 16, 2010
    Assignee: Alberta Research Council Inc.
    Inventors: Wei Li, Ross Chow, Jim Boyd Curtis, Xiaocai Joyce Chen
  • Publication number: 20080079943
    Abstract: A method for obtaining a reflectance property indication of a sample which includes making a reflectance measurement of the sample and correcting the reflectance measurement in order to obtain the reflectance property indication. The reflectance measurement represents an observed reflectance of the sample, the reflectance property indication represents a standardized reflectance of the sample, and correcting the reflectance measurement accounts for a difference between the standardized reflectance and the observed reflectance. An apparatus for making a reflectance measurement of a sample which includes a housing defining a viewing port, a temperature control mechanism for controlling the temperature within the interior of the housing, and an optical reflectometer contained within the interior of the housing. The reflectometer has a measurement direction and is movable within the housing so that the measurement direction can be selectively aligned with the viewing port.
    Type: Application
    Filed: September 27, 2006
    Publication date: April 3, 2008
    Applicant: ALBERTA RESEARCH COUNCIL INC.
    Inventors: Wei Li, Ross Chow, Jim Boyd Curtis, Xiaocai Joyce Chen