Abstract: A test pattern membrane test method uses a test pattern membrane to test the capacitive sensors of a device. The device is placed in the test fixture. The capacitive sensors are read without the test pattern membrane, storing as a set of baseline measurements. The test pattern membrane is placed on the unit to be tested. The test pattern membrane has a plurality of conductive areas on a non-conductive substrate. The conductive areas are arranged in a pattern that corresponds to the pattern of capacitive sensors. The sensors are read again to obtain a set of stimulated measurements. Differences for each of the sensors are determined between the sensor readings with and without the test pattern membrane in place. This difference is compared to a threshold. A sensor is considered to be functioning properly if the difference value is greater than the sensor's threshold value.

Abstract: A test pattern membrane test method uses a test pattern membrane to test the capacitive sensors of a device. The device is placed in the test fixture. The capacitive sensors are read without the test pattern membrane, storing as a set of baseline measurements. The test pattern membrane is placed on the unit to be tested. The test pattern membrane has a plurality of conductive areas on a non-conductive substrate. The conductive areas are arranged in a pattern that corresponds to the pattern of capacitive sensors. The sensors are read again to obtain a set of stimulated measurements. Differences for each of the sensors are determined between the sensor readings with and without the test pattern membrane in place. This difference is compared to a threshold. A sensor is considered to be functioning properly if the difference value is greater than the sensor's threshold value.