Abstract: A system for measuring and managing thermal operations of a processor core on a semiconductor die using a sensor positioned in a hotspot of the processor core. A measured temperature reading is determined based upon a temperature sensed by the sensor. Interrupt signals and a software readable register indicating temperature information provide feedback about the thermal environment to the processor. Based upon the measured temperature reading, the interrupt signals direct the processor to modify operation.

Abstract: For one disclosed embodiment, a plurality of processor cores may be on a semiconductor die. The processor cores may have at least one corresponding temperature sensor. Circuitry on the semiconductor die may generate thermal event indications based on sensed temperatures from multiple temperature sensors of multiple processor cores. A thermal event indication may indicate that a sensed temperature exceeds a temperature point. Central management logic on the semiconductor die may receive thermal event indications based on sensed temperatures from multiple temperature sensors of multiple processor cores. The central management logic may modify operation of one or more of the processor cores in response to a thermal event indication. Other embodiments are also disclosed.

Abstract: A method of creating a thermal influence table to describe thermal relationships between components in a system and use of the thermal influence table in a system is described. The thermal influence matrix may be generated dynamically for a system. The matrix may be used by a thermal management policy to enable a hot device to be cooled by power management of another device in the system.