Abstract: A translator fixture for use in testing a printed circuit board is provided. The fixture includes a plurality of translator plates for containing and supporting translator pins extending through the translator plates for positioning the translator pins for contacting test points on the circuit board, and a plurality of supports. Each of the supports includes a central portion and is mounted through a respective group of holes in the translator plates. The holes each include respective, substantially identically dimensioned central apertures that are oversized with respect to the central portions of the supports. At least one hole in each of the groups of holes includes at least one peripheral aperture extending outwardly from a periphery of the central aperture of the one hole.