Patents by Inventor Jim Hodgson

Jim Hodgson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Modular atomic force microscope with environmental controls
    Patent number: 10416190
    Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.
    Type: Grant
    Filed: February 28, 2017
    Date of Patent: September 17, 2019
    Assignee: Oxford Instruments Asylum Research Inc
    Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
  • Modular Atomic Force Microscope with Environmental Controls
    Publication number: 20170168089
    Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.
    Type: Application
    Filed: February 28, 2017
    Publication date: June 15, 2017
    Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
  • Modular atomic force microscope with environmental controls
    Patent number: 9581616
    Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.
    Type: Grant
    Filed: August 4, 2015
    Date of Patent: February 28, 2017
    Assignee: Oxford Instruments Asylum Research, Inc
    Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
  • Modular Atomic Force Microscope with Environmental Controls
    Publication number: 20150338438
    Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.
    Type: Application
    Filed: August 4, 2015
    Publication date: November 26, 2015
    Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson
  • Modular atomic force microscope with environmental controls
    Patent number: 9097737
    Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.
    Type: Grant
    Filed: November 25, 2013
    Date of Patent: August 4, 2015
    Assignee: Oxford Instruments Asylum Research, Inc.
    Inventors: Mario Viani, Roger Proksch, Maarten Rutgers, Jason Cleveland, Jim Hodgson