Patents by Inventor Jim J. Wei

Jim J. Wei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6792360
    Abstract: Systems and methods for identifying the presence of a defect in vibrating machinery. An exemplary method comprises analysis of frequency spectrum vibration data of the machine. The method comprises deriving a harmonic activity index based on estimates of the energy associated with the frequency spectrum and the energy associated with the defect's harmonic series. The method may comprise deriving a value K by estimating a value M indicative of the energy of the defect's harmonic series and dividing M by the number of spectral lines corresponding to the defect's harmonic series. The method may further comprise deriving a value R by estimating a value Q indicative of the energy in the frequency spectrum data and dividing Q by the number of spectral lines of the frequency spectrum data. The method further comprises deriving the harmonic activity index based on the estimated K and R. Related systems for executing the methods are also disclosed.
    Type: Grant
    Filed: December 4, 2002
    Date of Patent: September 14, 2004
    Assignee: SKF Condition Monitoring, Inc.
    Inventors: Adrianus J. Smulders, Jim J. Wei, Johannes I. Boerhout
  • Publication number: 20030130810
    Abstract: Systems and methods for identifying the presence of a defect in vibrating machinery. An exemplary method comprises analysis of frequency spectrum vibration data of the machine. The method comprises deriving a harmonic activity index based on estimates of the energy associated with the frequency spectrum and the energy associated with the defect's harmonic series. The method may comprise deriving a value K by estimating a value M indicative of the energy of the defect's harmonic series and dividing M by the number of spectral lines corresponding to the defect's harmonic series. The method may further comprise deriving a value R by estimating a value Q indicative of the energy in the frequency spectrum data and dividing Q by the number of spectral lines of the frequency spectrum data. The method further comprises deriving the harmonic activity index based on the estimated K and R. Related systems for executing the methods are also disclosed.
    Type: Application
    Filed: December 4, 2002
    Publication date: July 10, 2003
    Inventors: Adrianus J. Smulders, Jim J. Wei, Johannes I. Boerhout