Patents by Inventor Ji-Man Choi

Ji-Man Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SULFIDE-BASED SOLID ELECTROLYTE AND BATTERY
    Publication number: 20250038252
    Abstract: The present disclosure relates to a sulfide-based solid electrolyte having a new composition and a new crystal structure.
    Type: Application
    Filed: December 6, 2023
    Publication date: January 30, 2025
    Inventors: Sun Ho Choi, Yong Jun Jang, Yong Gu Kim, Seong Hyeon Choi, Sa Heum Kim, Sung Man Cho, Sang Uck Lee, Ji Hoon Kim, Ji Won Lee, Ji Seon Kim
  • ROBOT CLEANER, STATION AND CLEANING SYSTEM
    Publication number: 20250026023
    Abstract: A cleaning system is provided. The cleaning system includes a robot cleaner and a station. The robot cleaner includes a pad fixing part on which a cleaning pad is detachably mounted, a lifter to lift a part of the robot cleaner at which the pad fixing part is positioned, and a pad detacher to detach the cleaning pad mounted on the pad fixing part. The station includes a pad storage box in which a cleaning pad that is to be provided to the robot cleaner is stored, a pad coupling part on which a cleaning pad that is to be coupled to the robot cleaner is rested, and a pad supplier to supply the cleaning pad stored in the pad storage box to the pad coupling part.
    Type: Application
    Filed: October 7, 2024
    Publication date: January 23, 2025
    Inventors: Sin Ae KIM, Byoung In LEE, Dong Woo HA, Seok Man HONG, Dong Jun KIM, Ji Won CHOI
  • Method of fixing a probe needle to a needle fixture of a probe card in semiconductor inspection equipment
    Patent number: 7452438
    Abstract: A needle fixture of a probe card and a needle fixing method in semiconductor inspection equipment include a needle fixture of a probe card in semiconductor inspection equipment including a printed circuit board; a needle fixture installed in the printed circuit board; a resin unit affixing a probe needle to the needle fixture using an adhesive; and a separation preventer for preventing separation of the resin unit from the needle fixture, wherein the separation preventer includes: a plurality of notches formed along a bottom surface of the needle fixture; and the adhesive filling the plurality of notches.
    Type: Grant
    Filed: April 28, 2005
    Date of Patent: November 18, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyun-Sik Yu, Ji-Man Choi, In-Dae Shin
  • Semiconductor inspecting apparatus having device for cleaning tip of probe card and method for cleaning the tip
    Publication number: 20070199583
    Abstract: An apparatus for inspecting a semiconductor and a method for automatically cleaning the tip of a probe card may include an inspection chamber having a probe card for inspecting a wafer, and a chemical-wetting chamber for applying a chemical agent to a cleaning member. The inspection chamber and the chemical-wetting chamber may be integral parts of the apparatus.
    Type: Application
    Filed: February 28, 2007
    Publication date: August 30, 2007
    Inventors: Ji-Man Choi, Duk-Kyeom Kim, Byung-Jun Moon, Ju-Hyun Nam, In-Cheol Lee
  • Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof
    Publication number: 20050194986
    Abstract: A needle fixture of a probe card and a needle fixing method in semiconductor inspection equipment include a needle fixture of a probe card in semiconductor inspection equipment including a printed circuit board; a needle fixture installed in the printed circuit board; a resin unit affixing a probe needle to the needle fixture using an adhesive; and a separation preventer for preventing separation of the resin unit from the needle fixture, wherein the separation preventer includes: a plurality of notches formed along a bottom surface of the needle fixture; and the adhesive filling the plurality of notches.
    Type: Application
    Filed: April 28, 2005
    Publication date: September 8, 2005
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hyun-Sik Yu, Ji-Man Choi, In-Dae Shin
  • Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof
    Patent number: 6900653
    Abstract: A needle fixture of a probe card and a needle fixing method in semiconductor inspection equipment include a needle fixture of a probe card in semiconductor inspection equipment including a printed circuit board; a needle fixture installed in the printed circuit board; a resin unit affixing a probe needle to the needle fixture using an adhesive; and a separation preventer for preventing separation of the resin unit from the needle fixture, wherein the separation preventer includes: a plurality of notches formed along a bottom surface of the needle fixture; and the adhesive filling the plurality of notches.
    Type: Grant
    Filed: July 7, 2003
    Date of Patent: May 31, 2005
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyun-Sik Yu, Ji-Man Choi, In-Dae Shin
  • Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof
    Publication number: 20040004489
    Abstract: A needle fixture of a probe card and a needle fixing method in semiconductor inspection equipment include a needle fixture of a probe card in semiconductor inspection equipment including a printed circuit board; a needle fixture installed in the printed circuit board; a resin unit affixing a probe needle to the needle fixture using an adhesive; and a separation preventer for preventing separation of the resin unit from the needle fixture, wherein the separation preventer includes: a plurality of notches formed along a bottom surface of the needle fixture; and the adhesive filling the plurality of notches.
    Type: Application
    Filed: July 7, 2003
    Publication date: January 8, 2004
    Inventors: Hyun-Sik Yu, Ji-Man Choi, In-Dae Shin