Patents by Inventor Jimmie D. Walter

Jimmie D. Walter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and Systems for Characterization and Production of High Quality Silicon
    Publication number: 20130112134
    Abstract: Computer controlled quality control methods for manufacturing high purity polycrystalline granules are introduced. Polycrystalline silicon granules are sampled and converted into single crystal specimen in computer controlled system, eliminating the need of human operator in controlling the processing parameters. Single crystal silicon test samples, then characterized by FTIR and other standard analysis, are therefore more representative of the starting granular silicon.
    Type: Application
    Filed: August 31, 2012
    Publication date: May 9, 2013
    Applicant: GIGA INDUSTRIES, INC.
    Inventors: David C. Spencer, Jimmie D. Walter, Friedrich H. Doerbeck
  • Methods and Systems for Characterization and Production of High Purity Polysilicon
    Publication number: 20110290173
    Abstract: Computer controlled quality control methods for manufacturing high purity polycrystalline granules are introduced. Polycrystalline silicon granules are sampled and converted into single crystal specimen in computer controlled system, eliminating the need of human operator in controlling the processing parameters. Single crystal silicon test samples, then characterized by FTIR and other standard analysis, are therefore more representative of the starting granular silicon.
    Type: Application
    Filed: February 23, 2009
    Publication date: December 1, 2011
    Inventors: David C. Spencer, Jimmie D. Walter, Friedrich H. Doerbeck