Patents by Inventor Jimmie Jonnor

Jimmie Jonnor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DEVICES, SYSTEMS, AND METHODS FOR MONITORING A SPOT QUALITY OF AN ELECTRON BEAM
    Publication number: 20240066598
    Abstract: A method of monitoring a spot quality of an electron beam includes directing the electron beam to a first measurement point in a powder layer a plurality of times, adjusting a focus offset of the electron beam each of the plurality of times the electron beam is directed to the first measurement point, measuring x-ray emissions from the first measurement point each of the plurality of times the electron beam is directed to the first measurement point, and determining a drift in a focus or an intensity of the electron beam based on the measured x-ray emissions.
    Type: Application
    Filed: August 29, 2022
    Publication date: February 29, 2024
    Applicant: Arcam AB
    Inventors: Jimmie Jonnor, Jonas Hellgren