Patents by Inventor Jimmy Ba Luong

Jimmy Ba Luong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for collecting and displaying bit-fail-map information
    Patent number: 6845478
    Abstract: Disclosed is a method of testing memory, comprising providing one or more semiconductor wafers having one or more semiconductor chips thereon, each said chip comprising one or more memory cells, providing a programmable testing apparatus comprising at least one test pattern generators and a test bed adapted to receive said one or more wafers in communicative contact so as to address individual memory cells, chips, and wafers and transmit information thereto and receive information therefrom, receiving one or more test commands, constructing a test sequence of one or more commanded tests from said test commands, constructing at least one header comprising location information for each said wafer, chip and memory cell, testing said memory cells with a test pattern generated by said test pattern generator, collecting the results of said testing and passing them to a display device, passing said location information to said display device, constructing and displaying a graphical representation of said test result
    Type: Grant
    Filed: June 26, 2001
    Date of Patent: January 18, 2005
    Assignee: Infineon Technologies Richmond, LP
    Inventor: Jimmy Ba Luong
  • Method and apparatus for collecting and displaying bit-fail-map information
    Publication number: 20020199140
    Abstract: Disclosed is a method of testing memory, comprising providing one or more semiconductor wafers having one or more semiconductor chips thereon, each said chip comprising one or more memory cells, providing a programmable testing apparatus comprising at least one test pattern generators and a test bed adapted to receive said one or more wafers in communicative contact so as to address individual memory cells, chips, and wafers and transmit information thereto and receive information therefrom, receiving one or more test commands, constructing a test sequence of one or more commanded tests from said test commands, constructing at least one header comprising location information for each said wafer, chip and memory cell, testing said memory cells with a test pattern generated by said test pattern generator, collecting the results of said testing and passing them to a display device, passing said location information to said display device, constructing and displaying a graphical representation of said test result
    Type: Application
    Filed: June 26, 2001
    Publication date: December 26, 2002
    Applicant: Infineon Technologies Richmond , LP
    Inventor: Jimmy Ba Luong