Patents by Inventor Jimmy Jeter

Jimmy Jeter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9645052
    Abstract: Systems and methods for improving tire uniformity include identifying at least one candidate process harmonic and corresponding period. A set of uniformity waveforms is then collected for each test tire in a set of one or more test tires. To provide better data for analysis, the collection of waveforms may include multiple waveforms including measurements obtained before and/or after cure, in clockwise and/or counterclockwise rotational directions, and while the tire is loaded and/or unloaded. The uniformity waveforms may be re-indexed to the physical order of the at least one candidate process harmonic, and selected data points within the waveforms may optionally be deleted around a joint effect or other non-sinusoidal effect. The re-indexed, optionally partial, waveforms may then be analyzed to determine magnitude and azimuth estimates for the candidate process harmonics. Aspects of tire manufacture may then be modified in a variety of different ways to account for the estimated process harmonics.
    Type: Grant
    Filed: September 16, 2011
    Date of Patent: May 9, 2017
    Assignees: MICHELIN RECHERCHE et TECHNIQUE S.A., COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
    Inventors: William David Mawby, Jimmy Jeter, Jonathan Sauls, James Michael Traylor
  • Patent number: 9120280
    Abstract: A system and related method for improving tire uniformity includes providing a number (n) of test tires manufactured in a known order and identifying at least one candidate cyclic process effect with a corresponding frequency of introduction (f). A given uniformity parameter, such as radial or lateral run-out, balance, mass variation, radial lateral or tangential force variation, is measured for each tire in the test set, and measured data points are combined into a concatenated composite waveform. At least one process harmonic associated with each identified cyclic process effect is separated from the tire harmonics, for example, by Fourier transformation with identification of the process harmonics as positive integer multiples of the mth harmonic of the measured uniformity parameter where m=n/f. Once the process harmonics are extracted, filtered uniformity measurements can be provided or new tires can be built with the process effect minimized.
    Type: Grant
    Filed: April 29, 2010
    Date of Patent: September 1, 2015
    Assignees: MICHELIN RECHERCHE et TECHNIQUE S.A., COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
    Inventors: William David Mawby, Jimmy Jeter
  • Publication number: 20140338437
    Abstract: Systems and methods for improving tire uniformity include identifying at least one candidate process harmonic and corresponding period. A set of uniformity waveforms is then collected for each test tire in a set of one or more test tires. To provide better data for analysis, the collection of waveforms may include multiple waveforms including measurements obtained before and/or after cure, in clockwise and/or counterclockwise rotational directions, and while the tire is loaded and/or unloaded. The uniformity waveforms may be re-indexed to the physical order of the at least one candidate process harmonic, and selected data points within the waveforms may optionally be deleted around a joint effect or other non-sinusoidal effect. The re-indexed, optionally partial, waveforms may then be analyzed to determine magnitude and azimuth estimates for the candidate process harmonics. Aspects of tire manufacture may then be modified in a variety of different ways to account for the estimated process harmonics.
    Type: Application
    Filed: September 16, 2011
    Publication date: November 20, 2014
    Inventors: William David Mawby, Jimmy Jeter, Jonathan Sauls, James Michael Traylor