Patents by Inventor Jimmy Soon Yoong Yeap

Jimmy Soon Yoong Yeap has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9570134
    Abstract: Techniques for reducing latency in address decoding are described. According to one approach, a method of operating an addressing circuit comprises partitioning range of encoded addresses into a first and second subset of encoded addresses, sending a first encoded address to a address decode circuit from a controller. In response to determining that the first encoded address is contained in the first subset, decoding the first encoded address in a first duration. In response to determining that the first encoded address is contained in the second subset, decoding the first encoded address in a second duration which is longer than the first duration and simultaneously sending a halt signal to the controller to stop sending subsequent encoded addresses for decoding for the entirety of the second duration.
    Type: Grant
    Filed: March 31, 2016
    Date of Patent: February 14, 2017
    Assignee: Altera Corporation
    Inventors: Aaron Ferrucci, Jimmy Soon Yoong Yeap
  • Patent number: 8429591
    Abstract: Methods and apparatus useful for improving the performance of testing and diagnostic operations on user circuit designs potentially across multiple phases of the development lifecycle and across multiple implementation technologies are described. As one example, a single testing and diagnostic stimulus source can variously provide test pattern data to different potential instantiations of the user circuit design by supporting and selectively utilizing a number of DUT-facing communication channels.
    Type: Grant
    Filed: March 7, 2011
    Date of Patent: April 23, 2013
    Assignee: Altera Corporation
    Inventors: Gary Yu-Kwun Kwan, Jimmy Soon Yoong Yeap
  • Publication number: 20120060140
    Abstract: Methods and apparatus useful for improving the performance of testing and diagnostic operations on user circuit designs potentially across multiple phases of the development lifecycle and across multiple implementation technologies are described. As one example, a single testing and diagnostic stimulus source can variously provide test pattern data to different potential instantiations of the user circuit design by supporting and selectively utilizing a number of DUT-facing communication channels.
    Type: Application
    Filed: March 7, 2011
    Publication date: March 8, 2012
    Applicant: Altera Corporation
    Inventors: Gary Yu-Kwun Kwan, Jimmy Soon Yoong Yeap