Abstract: A handler for testing a semiconductor device which is used when testing the fabricated semiconductor device. The handler for testing a semiconductor device includes a stacker to supply and accommodate a customer tray and a position selecting device to move the stacker and select a position of the stacker. By efficiently operating the stacker, the handler is able to continuously handle a large amount of semiconductor devices in a same testing process or continuously handle semiconductor devices in different lots, and equipment is prevented from becoming larger or having more complex designs so that required space, production costs and manpower are reduced and operating rates are improved.

Abstract: A display may be provided with a color filter layer. The display may have a thin-film transistor layer and a layer of liquid crystal material that is interposed between the color filter layer and the thin-film transistor layer. The color filter layer may include an array of color filter elements on a transparent substrate. The color filter elements may be formed from colored photoresist. An inorganic layer may be deposited on the color filter elements. An opaque matrix such a black matrix formed from black photoresist may be formed on the inorganic layer. The color photoresist color filter elements may be rectangular and may be arranged on the transparent substrate in a rectangular array. The black matrix may contain an array of rectangular openings. Each of the openings of the black matrix may be aligned with a corresponding one of the color filter elements.

Abstract: Disclosed is a handler for testing a semiconductor device, which is used when testing the fabricated semiconductor device. The handler for testing a semiconductor device includes a stacker to supply and accommodate a customer tray and a position selecting device to move the stacker and select a position of the stacker. By efficiently operating the stacker, the handler is able to continuously handle a large amount of semiconductor devices in a same testing process or continuously handle semiconductor devices in different lots, and equipment is prevented from becoming larger or having more complex designs so that required space, production costs and manpower are reduced and operating rates are improved.

Abstract: A battery module includes a plurality of battery cells, a temperature sensor and a case. The plurality of battery cells are aligned in one direction. The temperature sensor has a first surface contacting at least one battery cell of the plurality of battery cells to measure a temperature of the at least one battery cell. The case presses against a second surface of the temperature sensor opposite to the first surface of the temperature sensor. In the battery module, the contact between the first surface of the temperature sensor and the battery cell is maintained by the case. Accordingly, the temperature sensor can precisely measure the temperature of the battery cell, thereby improving the safety of the battery module.

Abstract: A mask for forming a black matrix for a display device that includes a data line having a bending structure with respect to a central portion of a pixel region includes a edge frame having a rectangular shape, and a base plate disposed on the edge frame and including a light-transmitting portion and a light-blocking portion, wherein the light-transmitting portion includes first light-transmitting patterns and light-controlling portions between adjacent first light-transmitting patterns, and the light-transmitting portion further includes a bending portion corresponding to the central portion of the pixel region, and wherein the bending portion is disposed with a same distance from the light-transmitting patterns adjacent thereto.

Abstract: Provided are an apparatus for collecting gas samples in a foam and an analysis method using the same, and more particularly, to an apparatus for collecting gas samples in a foam in which the foam is grinded, such that the gas sample in the foam may be effectively collected, and pressure before and after collection of the gas samples may be measured to thereby increase accuracy of gas analysis, such that characteristics of the foam may be more accurately evaluated, and an analysis method using the same.

Abstract: A method for fabricating a process substrate includes: providing a first substrate; providing a substrate and an auxiliary substrate; contacting the substrate and the auxiliary substrate with each other in a vacuum state, thereby forming micro spaces of a vacuum state between the substrate and the auxiliary substrate; and increasing a pressure at the outside of the contacted substrate and auxiliary substrate to attach the substrate and the auxiliary substrate to each other by a pressure difference between the micro spaces and the outside of the contacted substrate and auxiliary substrate.

Abstract: A battery module may include batteries that include electrode terminals, and a measurement member that measures one or more of a voltage, a current, or a temperature of each of the batteries. The measurement member may include receiving portions, and the battery module may include connection members that electrically connecting electrode terminals of neighboring batteries. Each of the connection members may include a protrusion extending therefrom, and each protrusion may be electrically connected to the measurement member. Each protrusion may also include an uppermost surface that faces away from the batteries, and the uppermost surface of each protrusion may engage one of the receiving portions.

Abstract: Provided is a substrate treating method. The substrate treating method may include treating a substrate by using a chemical solution; rinsing the substrate by using pure water after treating the substrate by using the chemical solution; and treating the substrate by using an organic solvent, wherein the substrate treating method further includes coating the substrate with a hydrophobic membrane between the treating of the chemical solution and the treating of the organic solvent.

Abstract: A method for fabricating a process substrate includes: providing a first substrate; providing a substrate and an auxiliary substrate; contacting the substrate and the auxiliary substrate with each other in a vacuum state, thereby forming micro spaces of a vacuum state between the substrate and the auxiliary substrate; and increasing a pressure at the outside of the contacted substrate and auxiliary substrate to attach the substrate and the auxiliary substrate to each other by a pressure difference between the micro spaces and the outside of the contacted substrate and auxiliary substrate.

Abstract: A mask for forming a black matrix for a display device that includes a data line having a bending structure with respect to a central portion of a pixel region includes a edge frame having a rectangular shape, and a base plate disposed on the edge frame and including a light-transmitting portion and a light-blocking portion, wherein the light-transmitting portion includes first light-transmitting patterns and light-controlling portions between adjacent first light-transmitting patterns, and the light-transmitting portion further includes a bending portion corresponding to the central portion of the pixel region, and wherein the bending portion is disposed with a same distance from the light-transmitting patterns adjacent thereto.

Abstract: The present invention relates to a system for measuring an absolute quantity of each component of a gas using a QMS, more particularly to a system for measuring an absolute quantity of each component of a gas using a QMS, which is capable of performing not only a qualitative analysis but also a quantitative analysis in an accurate manner, using just a trace amount of gas introduced through a pinhole. According to the present invention, the productivity of products can be improved, and production management can be performed in an efficient manner, thereby improving industrial competitiveness.

Abstract: Provided are an apparatus for collecting gas samples in a foam and an analysis method using the same, and more particularly, to an apparatus for collecting gas samples in a foam in which the foam is grinded, such that the gas sample in the foam may be effectively collected, and pressure before and after collection of the gas samples may be measured to thereby increase accuracy of gas analysis, such that characteristics of the foam may be more accurately evaluated, and an analysis method using the same.

Abstract: Provided is a method for detecting an airborne noxious substance using radio-frequency inductive coupled plasma-mass spectroscopy (ICP-MS). The method includes: supplying a gas to be detected to a radio-frequency inductive coupled plasma; supplying oxygen gas to the gas introduced to the plasma to generate the oxide ion of a noxious element; and detecting the mass of the oxide ion of the noxious element. The method requires no separate pretreatment for detecting an airborne noxious substance, uses the ambient air itself as an analyte, and allows detection of the existence and amount of a noxious substance with high accuracy in a rapid and simple manner.