Patents by Inventor Jin Geun Kim

Jin Geun Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Superconducting DC reactor
    Patent number: 9640309
    Abstract: A DC reactor consisting of a coil formed of a superconducting material is provided. It is possible to reduce leakage reactance and to increase critical current by using a coil formed of a high temperature superconducting material and forming a first bobbin of the DC reactor as a toroid shape.
    Type: Grant
    Filed: October 25, 2012
    Date of Patent: May 2, 2017
    Assignee: INDUSTRY-ACADEMIC COOPERATION FOUNDATION CHANGWON NATIONAL UNIVERSITY
    Inventors: Minwon Park, In-Keun Yu, Jin Geun Kim, Sang Jin Lee, Seock-Ho Kim, Sung-Kyu Kim, Young-Jin Won, Hak-Man Kim, Kyu-Won Jeong
  • SUPERCONDUCTING DC REACTOR
    Publication number: 20150057158
    Abstract: A DC reactor consisting of a coil formed of a superconducting material is provided. It is possible to reduce leakage reactance and to increase critical current by using a coil formed of a high temperature superconducting material and forming a first bobbin of the DC reactor as a toroid shape.
    Type: Application
    Filed: October 25, 2012
    Publication date: February 26, 2015
    Inventors: Minwon Park, In-Keun Yu, Jin Geun Kim, Sang Jin Lee
  • Quality evaluation method for single crystal ingot
    Patent number: 7326292
    Abstract: The inventive quality evaluation method for a single crystal ingot generally includes a step of determining cropping and sampling positions and a step of evaluating a sample. The step of determining cropping and sampling positions includes: (a) inputting basic information on the decision of cropping, sampling and prime positions according to equipments and products, (b) predetermining the cropping, sampling and prime positions according to the basic information, (c) monitoring a growing process of a growing ingot and analyzing/storing X factors related with the growing process of the growing ingot, and (d) determining the cropping and sampling positions based on the X factors related with the growing process.
    Type: Grant
    Filed: June 14, 2006
    Date of Patent: February 5, 2008
    Assignee: Siltron Inc.
    Inventors: Jin Geun Kim, Hyon Jong Cho