Abstract: An organic electroluminescent display device includes an organic light-emitting diode, a first transistor outputting a data voltage by an nth scan signal (n is a natural number), a second transistor providing a current to the organic light-emitting by the data voltage, a capacitor storing the data voltage, and a third transistor supplying the second transistor and the capacitor with a pre-charge voltage by an (n?1)th scan signal, the pre-charge voltage having an opposite polarity to the data voltage.

Abstract: In a Multi-Protocol Label Switching (MPLS) network and a method of applying a mobile IP to the MPLS network, the method includes: performing label assignment using a label-tunnel configured by doubly stacking a label between a first edge router and a second edge router upon a Mobile Node (MN) moving from a position of the first edge router to a position of the second edge router; and including label mapping information based on the assigned label in a registration request message in the second edge router, and transmitting the included label mapping information from the second edge router to the first edge router.

Abstract: An apparatus and method for transmitting multi-protocol label switching (MPLS) multicast packets over Ethernet are provided. The apparatus and method determine whether a received packet is an MPLS multicast packet; determine whether an address of the received packet exists in a database storing address information for MPLS multicast packet transmission; determine which node the MPLS multicast packet whose address exists in the database is transmitted to and allocating an MPLS label according to the address of the determined node; and map the allocated MPLS label to an Ethernet destination MAC address of the packet in order to realize simple switching by mapping an MPLS label, rather than a conventional IP address, to an Ethernet destination medium access control (MAC) address, thereby utilizing advantages of an MPLS network.

Abstract: Disclosed is a fast rerouting apparatus and method for multiprotocol label switching (MPLS) multicast. The fast rerouting apparatus and method is to rapidly cope with a failure occurring on an MPLS network. The fast rerouting method of redirecting a packet to be transmitted at the nearest location from a location where the failure occurs is applied to the MPLS multicast, so that it is possible to rapidly cope with the failure generated when an MPLS multicast packet is transmitted.

Abstract: A Multi-Protocol Label Switching (MPLS) edge router includes: a label information table storage unit adapted to store NextHop information to route a label packet to an Internet Protocol (IP) network and interface information to transmit the label packet to a NextHop; an Internet Protocol routing module adapted to manage and maintain the label information table storage unit; and an MPLS forwarding engine adapted to delete a label by accessing the label information table storage unit and searching the interface information and the NextHop information stored therein, and transmitting an IP packet to the corresponding interface upon receiving the label packet to be transmitted to the IP network.

Abstract: A method of fabricating a SOI substrate is disclosed, which includes the steps of: forming trenches in the Si substrate; forming an oxidation preventing film over the Si substrate and at the side-walls of the trenches; forming grooves at the bottoms of trenches by etching the Si substrate using the oxidation preventing film as a mask; carrying out an oxidation using to form an oxide film and a Si device layer isolated by the oxide film; removing the oxidation preventing film; and carrying out a planarization to form the silicon-on-insulator substrate having a planar surface.

Abstract: A method and apparatus for measuring the metallurgical channel length of a semiconductor device includes the steps of determining capacitance of gate to substrate in a multiple MOS transistor pattern and MOS capacitor pattern which have the same gate area; subtracting the capacitance of gate to substrate in a MOS transistor from that in a MOS capacitor for providing a difference curve; determining the overlap length by using the capacitance corresponding to a peak shown in the differences curve; and subtracting two times the overlap length .DELTA.L from the gate length Ldrawn in the MOS transistor for providing the metallurgical channel length.