Patents by Inventor Jin-Myoung LEE

Jin-Myoung LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240136531
    Abstract: A conductive composite material, a method of preparing the same, and a secondary battery including the same. The conductive composite material may increase the proportion of an active material when forming an electrode by chemically bonding a conductive material and a binder to each other. A method of preparing the conductive composite material comprises ionizing carbon-based particles in a predetermined polarity, ionizing PTFE particles in a polarity different from that of the carbon-based particles, and chemically bonding the ionized carbon-based particles and the ionized PTFE particles, which are ionized in different polarities, to each other.
    Type: Application
    Filed: September 20, 2023
    Publication date: April 25, 2024
    Inventors: Seung Min Oh, Sung Ho Ban, Sang Hun Lee, Ko Eun Kim, Yoon Sung Lee, Chang Hoon Song, Hyeong Jun Choi, Jun Myoung Sheem, Jin Kyo Koo, Young Jun Kim
  • Publication number: 20240108536
    Abstract: A thermo-therapeutic apparatus and a method for controlling the same are provided.
    Type: Application
    Filed: December 14, 2023
    Publication date: April 4, 2024
    Applicant: CERAGEM CO., LTD
    Inventors: Dong Myoung LEE, Ki Sung KIM, Sang Cheol HAN, Jin Cheol PARK
  • Publication number: 20220216120
    Abstract: A pattern design for defect inspection, the pattern design including a first floating conductive line; a second floating conductive line; and a grounded conductive line disposed between the first floating conductive line and the second floating conductive line. The first floating conductive line, the second floating conductive line, and the grounded conductive line are divided into a main pad region, a plurality of subregions, a plurality of sub-pad regions, and a ground region. The main pad region is positioned at a first end portion of the pattern design. The ground region is positioned at a second end portion of the pattern design. The plurality of subregions and the plurality of sub-pad regions are positioned between the main pad region and the ground region.
    Type: Application
    Filed: March 25, 2022
    Publication date: July 7, 2022
    Inventors: JONG SOO BAEK, JIN MYOUNG LEE, MIN SOO KANG, HYUN AH ROH, BO YOUNG LEE
  • Patent number: 11315841
    Abstract: A pattern design for defect inspection, the pattern design including a first floating conductive line; a second floating conductive line; and a grounded conductive line disposed between the first floating conductive line and the second floating conductive line. The first floating conductive line, the second floating conductive line, and the grounded conductive line are divided into a main pad region, a plurality of subregions, a plurality of sub-pad regions, and a ground region. The main pad region is positioned at a first end portion of the pattern design. The ground region is positioned at a second end portion of the pattern design. The plurality of subregions and the plurality of sub-pad regions are positioned between the main pad region and the ground region.
    Type: Grant
    Filed: October 8, 2019
    Date of Patent: April 26, 2022
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jong Soo Baek, Jin Myoung Lee, Min Soo Kang, Hyun Ah Roh, Bo Young Lee
  • Publication number: 20220093103
    Abstract: An audio recording management method includes creating a text transcript of an audio recording by converting speech to text, matching and managing the text transcript and a memo written during recording or playback of the audio, and providing the text transcript in connection with the memo.
    Type: Application
    Filed: September 23, 2021
    Publication date: March 24, 2022
    Inventors: Jieun SHIN, Gil Hwan HWANG, Ye Lim JEONG, Dai-Hyun LIM, SuMee LEE, Hyangnam OH, Junghoon JANG, Namkyu JUNG, Geonmin KIM, Deok Su KIM, Hyunjin KIM, Daigeun SOHN, Yeon Soo SONG, Dongyeol LEE, Jin-myoung LEE, Yujin JEON, Jongmin CHOI
  • Publication number: 20200335407
    Abstract: A pattern design for defect inspection, the pattern design including a first floating conductive line; a second floating conductive line; and a grounded conductive line disposed between the first floating conductive line and the second floating conductive line. The first floating conductive line, the second floating conductive line, and the grounded conductive line are divided into a main pad region, a plurality of subregions, a plurality of sub-pad regions, and a ground region. The main pad region is positioned at a first end portion of the pattern design. The ground region is positioned at a second end portion of the pattern design. The plurality of subregions and the plurality of sub-pad regions are positioned between the main pad region and the ground region.
    Type: Application
    Filed: October 8, 2019
    Publication date: October 22, 2020
    Inventors: JONG SOO BAEK, JIN MYOUNG LEE, MIN SOO KANG, HYUN AH ROH, BO YOUNG LEE
  • Patent number: 9291669
    Abstract: A semiconductor device, a test structure of the semiconductor device, and a method of testing the semiconductor device are provided. The test structure including a first pad and a second pad being separated from each other, and a first test element and a second test element connected between the first pad and the second pad, a first value of a characteristic parameter of the first test element being different from a second value of the characteristic parameter of the second test element, may be provided.
    Type: Grant
    Filed: August 28, 2014
    Date of Patent: March 22, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jin-Myoung Lee, Il-Kwon Lee, Jun-Woo Lee, Sang-Goo Jung, Kyoung-Mi Park, In-Ae Lee
  • Publication number: 20150113343
    Abstract: A semiconductor device, a test structure of the semiconductor device, and a method of testing the semiconductor device are provided. The test structure including a first pad and a second pad being separated from each other, and a first test element and a second test element connected between the first pad and the second pad, a first value of a characteristic parameter of the first test element being different from a second value of the characteristic parameter of the second test element, may be provided.
    Type: Application
    Filed: August 28, 2014
    Publication date: April 23, 2015
    Inventors: Jin-Myoung LEE, Il-Kwon LEE, Jun-Woo LEE, Sang-Goo JUNG, Kyoung-Mi PARK, In-Ae LEE