Abstract: An image restoration apparatus includes: an image acquisition unit that acquires a mask image generated by masking, by a mask region, a predetermined region of an article image in which an article is imaged; and an image output unit that outputs a restored image corresponding to the mask image acquired by the image acquisition unit by using a restorer pre-trained by machine learning so as to output the restored image, which is restored from the mask image to reproduce the article image in a pseudo manner, according to an input of the mask image.

Abstract: An image restoration apparatus includes: an image acquisition unit that acquires a mask image generated by masking, by a mask region, a predetermined region of an article image in which an article is imaged; and an image output unit that outputs a restored image corresponding to the mask image acquired by the image acquisition unit by using a restorer pre-trained by machine learning so as to output the restored image, which is restored from the mask image to reproduce the article image in a pseudo manner, according to an input of the mask image.

Abstract: A surface inspection apparatus includes: an inspection pattern forming unit that forms inspection patterns; a projection unit that projects the inspection patterns onto an inspection target object; a captured image acquiring unit that acquires captured images of the inspection target object; an edge extraction image creating unit that extracts edges from captured images, and creates edge extraction images; a correction coefficient setting unit that sets a correction coefficient for correcting intensities of edges in the edge extraction image; an intensity correcting unit that corrects the intensities of the edges; a corrected edge extraction image creating unit that creates corrected edge extraction images; an integrated image creating unit that creates a single integrated image by integrating the brightness values at the same position of the inspection target object; and a determination unit that determines the presence or absence of unevenness on a surface of the inspection target object.

Abstract: A surface inspection apparatus includes: an inspection pattern forming unit that forms inspection patterns; a projection unit that projects the inspection patterns onto an inspection target object; a captured image acquiring unit that acquires captured images of the inspection target object; an edge extraction image creating unit that extracts edges from captured images, and creates edge extraction images; a correction coefficient setting unit that sets a correction coefficient for correcting intensities of edges in the edge extraction image; an intensity correcting unit that corrects the intensities of the edges; a corrected edge extraction image creating unit that creates corrected edge extraction images; an integrated image creating unit that creates a single integrated image by integrating the brightness values at the same position of the inspection target object; and a determination unit that determines the presence or absence of unevenness on a surface of the inspection target object.

Abstract: The present invention relates to an optical phase measuring method and an optical phase measuring device which can measure phase information contained in an object beam with high accuracy. Intensity distributions of a test object beam, a first reference beam and a first hologram made from the object beam and the first reference beam are detected by the first light intensity detection section. Intensity distributions of the test object beam, a second reference beam and a second hologram made from the object beam and the second reference beam are detected in the second light intensity detection section. Phase information contained in the object beam is computed on the basis of the intensity distributions detected in the first light intensity detection section and the intensity distributions detected in the second light intensity detection section.

Abstract: The present invention relates to an optical phase measuring method and an optical phase measuring device which can measure phase information contained in an object beam with high accuracy. Intensity distributions of a test object beam, a first reference beam and a first hologram made from the object beam and the first reference beam are detected by the first light intensity detection section. Intensity distributions of the test object beam, a second reference beam and a second hologram made from the object beam and the second reference beam are detected in the second light intensity detection section. Phase information contained in the object beam is computed on the basis of the intensity distributions detected in the first light intensity detection section and the intensity distributions detected in the second light intensity detection section.