Patents by Inventor Jindong Cui

Jindong Cui has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11846539
    Abstract: A method and a system measure interfering influences on a checkweighing device. In the method, external interference data are obtained, as are interference data from the checkweighing device itself and interference data from an object being weighed, by calculating or mapping the weighing error data in the stationary state, in the operating state, and in the weighing state. The system for measuring the interference uses a meter and a processing apparatus. The meter and the processing apparatus perform an interference measurement and a compensation method. The amount of interference in the checkweighing device in each state and the amount of influence of the interference on the weighing performance is obtained, thereby facilitating the production, debugging, maintenance, and use of a checkweighing device.
    Type: Grant
    Filed: April 23, 2021
    Date of Patent: December 19, 2023
    Assignees: Mettler-Toledo (Changzhou) Precision Instruments Ltd, Mettler-Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.
    Inventors: Shenhui Wang, Huifang Wu, Ming Cai, Qi Han, Dongjie Qiu, Wenjun Jiang, Jindong Cui, Bin Zhu
  • Publication number: 20220252448
    Abstract: A weighing method comprises the steps of: recognizing one or more objects to be detected on a first scale platform top (A) or within an object recognition area of the first scale platform top (A), and weighing the objects to be detected that are placed on a second scale platform top (B). A weighing system comprises at least two scales having scale platform tops utilizing the weighing method outlined above. The weighing method reduces the difficulty of algorithm recognition by increasing the degree to which the object on the weighting platform fits the algorithm, reduces the complexity of operation flow and the time required, and effectively increases the precision and accuracy of object recognition.
    Type: Application
    Filed: July 29, 2020
    Publication date: August 11, 2022
    Inventors: Song Zhang, Shenhui Wang, Shenjian Qian, Jindong Cui, Gang Yang
  • Publication number: 20210372847
    Abstract: A method and a system measure interfering influences on a checkweighing device. In the method, external interference data are obtained, as are interference data from the checkweighing device itself and interference data from an object being weighed, by calculating or mapping the weighing error data in the stationary state, in the operating state, and in the weighing state. The system for measuring the interference uses a meter and a processing apparatus. The meter and the processing apparatus perform an interference measurement and a compensation method. The amount of interference in the checkweighing device in each state and the amount of influence of the interference on the weighing performance is obtained, thereby facilitating the production, debugging, maintenance, and use of a checkweighing device.
    Type: Application
    Filed: April 23, 2021
    Publication date: December 2, 2021
    Inventors: Shenhui Wang, Huifang Wu, Ming Cai, Qi Han, Dongjie Qiu, Wenjun Jiang, Jindong Cui, Bin Zhu