Abstract: This invention provides a method for synthesizing glycolide using methyl glycolate as a raw material, comprising two steps as illustrated in the following reaction formulas: wherein, the ROH represents a straight/branched chain alcohol, acid or ester containing 18-30 carbons and at least one hydroxyl group. The method for glycolide synthesis disclosed in the present invention manages to maintain a low viscosity within the reaction system by introducing a high-boiling alcohol into the reaction system to form a larger alkoxy glycolate exhibiting a significantly lower molecular weight compared to the typical glycolic acid oligomers utilized in the conventional process. Thus the challenges of coking and inefficient heat transfer encountered in traditional glycolide synthesis routes are effectively addressed.

Abstract: A test method includes: providing an initialization command to a ZQ calibration module such that the resistance value of a termination resistor is a first extreme value; providing a ZQ calibration command to the ZQ calibration module such that the resistance value of the termination resistor increases or decreases to a second extreme value from the first extreme value, one of the first extreme value and the second extreme value being a maximum value while the other one being a minimum value; acquiring a first time node, the first time node being a transmitting time for the ZQ calibration command; acquiring a second time node; and acquiring the ZQ calibration time based on the second time node and the first time node.

Abstract: A method for testing a memory chip includes: in response to read command for the memory chip, controlling clock signal to be kept in first state within first preset time period and at the same time controlling complementary clock signal to be kept in second state within first preset time period; in response to clock signal kept in the first state and complementary clock signal kept in the second state, keeping data strobe signal in the first state within second preset time period and at the same time keeping complementary data strobe signal in the second state within the second preset time period; and when the data strobe signal and the complementary data strobe signal are kept in first and second states respectively, controlling first and second driving modules connected respectively to data strobe terminal and complementary data strobe terminal to operate and measure first and second resistance values respectively.

Abstract: A method for testing a memory chip includes: in response to read command for the memory chip, controlling clock signal to be kept in first state within first preset time period and at the same time controlling complementary clock signal to be kept in second state within first preset time period; in response to clock signal kept in the first state and complementary clock signal kept in the second state, keeping data strobe signal in the first state within second preset time period and at the same time keeping complementary data strobe signal in the second state within the second preset time period; and when the data strobe signal and the complementary data strobe signal are kept in first and second states respectively, controlling first and second driving modules connected respectively to data strobe terminal and complementary data strobe terminal to operate and measure first and second resistance values respectively.

Abstract: A test method includes: providing an initialization command to a ZQ calibration module such that the resistance value of a termination resistor is a first extreme value; providing a ZQ calibration command to the ZQ calibration module such that the resistance value of the termination resistor increases or decreases to a second extreme value from the first extreme value, one of the first extreme value and the second extreme value being a maximum value while the other one being a minimum value; acquiring a first time node, the first time node being a transmitting time for the ZQ calibration command; acquiring a second time node; and acquiring the ZQ calibration time based on the second time node and the first time node.