Patents by Inventor Jingle LIU

Jingle LIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9110022
    Abstract: Methods and systems for detecting radiation for example, terahertz radiation, with the aid of acoustic signal generation and detection include: directing an optical beam into a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting an acoustic signal produced from an interaction of a radiation wave with the plasma. The methods and systems are particularly adapted for remote detection of chemicals, biological substances, and explosives, among others. The capability of the methods and systems can be enhanced by employing multi-color laser excitation to produce the plasma and varying the time delay between the multi-color pulses.
    Type: Grant
    Filed: April 29, 2011
    Date of Patent: August 18, 2015
    Assignee: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Benjamin Clough, Jingle Liu, Xi-Cheng Zhang
  • Patent number: 8674304
    Abstract: Methods and systems for characterizing a plasma with radiation, particularly, terahertz (THz) radiation, are disclosed. The disclosed method of characterizing a plasma includes directing THz radiation into the plasma; and detecting an emission due to interaction of the THz radiation with the plasma to characterize the plasma. A disclosed plasma characterizing device includes a means for directing THz radiation into a plasma; and a detector adapted to detect an emission emitted by the plasma due to interaction of the THz radiation with the plasma to characterize the plasma. A plasma characterizing system is also disclosed. The emission detected may be a fluorescence, a variation in fluorescence and/or an acoustic emission.
    Type: Grant
    Filed: April 29, 2011
    Date of Patent: March 18, 2014
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jingle Liu
  • Patent number: 8653462
    Abstract: Methods and systems for detecting radiation, particularly, terahertz (THz) radiation, are disclosed. The methods and systems disclosed include directing an optical beam in a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting a fluorescence produced from an interaction of a radiation wave with the plasma. The information contained in the characteristics of the detected fluorescence, for example, the amplitude and/or phase are used to characterize the radiation wave. Aspects of the invention may be used for homeland security, medicine, and astronomy, among other fields.
    Type: Grant
    Filed: April 27, 2011
    Date of Patent: February 18, 2014
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jingle Liu
  • Publication number: 20130153790
    Abstract: Methods and systems for detecting radiation for example, terahertz radiation, with the aid of acoustic signal generation and detection include: directing an optical beam into a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting an acoustic signal produced from an interaction of a radiation wave with the plasma. The methods and systems are particularly adapted for remote detection of chemicals, biological substances, and explosives, among others. The capability of the methods and systems can be enhanced by employing multi-color laser excitation to produce the plasma and varying the time delay between the multi-color pulses.
    Type: Application
    Filed: April 29, 2011
    Publication date: June 20, 2013
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Benjamin Clough, Jingle Liu, Xi-Cheng Zhang
  • Publication number: 20120193535
    Abstract: Methods and systems for characterizing a plasma with radiation, particularly, terahertz (THz) radiation, are disclosed. The disclosed method of characterizing a plasma includes directing THz radiation into the plasma; and detecting an emission due to interaction of the THz radiation with the plasma to characterize the plasma. A disclosed plasma characterizing device includes a means for directing THz radiation into a plasma; and a detector adapted to detect an emission emitted by the plasma due to interaction of the THz radiation with the plasma to characterize the plasma. A plasma characterizing system is also disclosed. The emission detected may be a fluorescence, a variation in fluorescence and/or an acoustic emission.
    Type: Application
    Filed: April 29, 2011
    Publication date: August 2, 2012
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Xi-Cheng ZHANG, Jingle LIU
  • Publication number: 20110272584
    Abstract: Methods and systems for detecting radiation, particularly, terahertz (THz) radiation, are disclosed. The methods and systems disclosed include directing an optical beam in a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting a fluorescence produced from an interaction of a radiation wave with the plasma. The information contained in the characteristics of the detected fluorescence, for example, the amplitude and/or phase are used to characterize the radiation wave. Aspects of the invention may be used for homeland security, medicine, and astronomy, among other fields.
    Type: Application
    Filed: April 27, 2011
    Publication date: November 10, 2011
    Applicant: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng ZHANG, Jingle LIU