Abstract: In a low drop out (LDO) regulator and a semiconductor device including the LDO regulator, the LDO regulator regulates a power supply voltage and applies the regulated power supply voltage to a load. The LDO regulator comprises: an output node connected to the load; a pass transistor that applies a power supply voltage to the output node; and a controller that generates a load enable signal enabling the load by delaying a regulator enable signal by a first delay time, and that increases a gate voltage of the pass transistor after receiving the regulator enable signal to thereby reduce a current flowing through the pass transistor.

Abstract: In a low drop out (LDO) regulator and a semiconductor device including the LDO regulator, the LDO regulator regulates a power supply voltage and applies the regulated power supply voltage to a load. The LDO regulator comprises: an output node connected to the load; a pass transistor that applies a power supply voltage to the output node; and a controller that generates a load enable signal enabling the load by delaying a regulator enable signal by a first delay time, and that increases a gate voltage of the pass transistor after receiving the regulator enable signal to thereby reduce a current flowing through the pass transistor.

Abstract: A method and apparatus for generating multi-phase clock signals. The multi-phase generating method includes: generating L reference clock signal groups having predetermined phase delay intervals from an external clock signal, wherein each reference clock signal group includes M sub reference clock signals; averaging phases of sub reference clock signals for each reference clock signal group, and generating L main reference clock signals from the L×M sub reference clock signals; and sequentially delaying the L main reference clock signals, and generating the N multi-phase clock signals having the different phases. Because a plurality of clock signals having equal phase delay intervals between each other are generated regardless of the frequency of a received clock signal, the yield of Delay Locked Loop (DLL) circuits is improved using the multi-phase generating apparatus.

Abstract: Provided are an apparatus and method of reducing a glitch in a switching device. The apparatus includes a latch latching a digital input signal and providing a digital output signal, a switching device segment unit including at least two switching device segment units, each one of the at least two switching device segment units switching a portion of the digital signal output, a glitch detection unit detecting a glitch generated within the switching device segment unit; and a voltage/current converter generating a latch control signal in response to an output from the glitch detection unit associated with a detected glitch, the latch control signal controlling an overlap of the digital output signal to reduce the glitch.

Abstract: A method and apparatus for generating multi-phase clock signals. The multi-phase generating method includes: generating L reference clock signal groups having predetermined phase delay intervals from an external clock signal, wherein each reference clock signal group includes M sub reference clock signals; averaging phases of sub reference clock signals for each reference clock signal group, and generating L main reference clock signals from the L×M sub reference clock signals; and sequentially delaying the L main reference clock signals, and generating the N multi-phase clock signals having the different phases. Because a plurality of clock signals having equal phase delay intervals between each other are generated regardless of the frequency of a received clock signal, the yield of Delay Locked Loop (DLL) circuits is improved using the multi-phase generating apparatus.

Abstract: Provided are an apparatus and method of reducing a glitch in a switching device. The apparatus includes a latch latching a digital input signal and providing a digital output signal, a switching device segment unit including at least two switching device segment units, each one of the at least two switching device segment units switching a portion of the digital signal output, a glitch detection unit detecting a glitch generated within the switching device segment unit; and a voltage/current converter generating a latch control signal in response to an output from the glitch detection unit associated with a detected glitch, the latch control signal controlling an overlap of the digital output signal to reduce the glitch.