Abstract: A split gate type flash memory device and a method of manufacturing the split gate type flash memory device are disclosed. The split gate type flash memory device includes a silicon epitaxial layer formed in an active region of a bulk silicon substrate and a disturbance-preventing insulating film formed in the bulk silicon substrate between a source region and a drain region of the device. According to selected embodiments of the invention, the disturbance-preventing insulating film is formed using a Shallow Trench Isolation (STI) forming process.

Abstract: A split gate type flash memory device and a method of manufacturing the split gate type flash memory device are disclosed. The split gate type flash memory device includes a silicon epitaxial layer formed in an active region of a bulk silicon substrate and a disturbance-preventing insulating film formed in the bulk silicon substrate between a source region and a drain region of the device. According to selected embodiments of the invention, the disturbance-preventing insulating film is formed using a Shallow Trench Isolation (STI) forming process.

Abstract: A non-volatile memory device and method of fabricating same are disclosed. The memory device comprises; a gate insulating film formed on a semiconductor substrate, a floating gate completely covering the gate insulating film, the floating gate comprising a conductive film pattern and a conductive spacer formed at one side of the conductive film pattern, a tunnel insulating film formed on a portion of the conductive film pattern, the conductive spacer, and extending laterally outward over a portion of the semiconductor substrate adjacent the conductive spacer, a control gate formed on the tunnel insulating film, a first impurity region formed within the semiconductor substrate proximate one side of the conductive film pattern opposite the conductive spacer, and a second impurity region formed within the semiconductor substrate proximate one side of the control gate disposed laterally outward from the floating gate.

Abstract: A split gate type flash memory device and a method of manufacturing the split gate type flash memory device are disclosed. The split gate type flash memory device includes a silicon epitaxial layer formed in an active region of a bulk silicon substrate and a disturbance-preventing insulating film formed in the bulk silicon substrate between a source region and a drain region of the device. According to selected embodiments of the invention, the disturbance-preventing insulating film is formed using a Shallow Trench Isolation (STI) forming process.

Abstract: A method of manufacturing a floating gate provides an enhancement for the efficiencies of electron charge and injection. First, a conductive pattern, constituting the floating gate is formed on a substrate. A first insulation layer is formed on a sidewall of the conductive pattern, and then a second insulation layer is formed at an upper portion of the conductive pattern in ways that increase the sharpness of an edge portion where the sidewall and upper portions of the conductive pattern meet. Therefore, electron transference from the floating ate to a control gate is facilitated.

Abstract: A split gate type flash memory device and a method of manufacturing the split gate type flash memory device are disclosed. The split gate type flash memory device includes a silicon epitaxial layer formed in an active region of a bulk silicon substrate and a disturbance-preventing insulating film formed in the bulk silicon substrate between a source region and a drain region of the device. According to selected embodiments of the invention, the disturbance-preventing insulating film is formed using a Shallow Trench Isolation (STI) forming process.

Abstract: A method of manufacturing a floating gate provides an enhancement for the efficiencies of electron discharge and injection. First, a conductive pattern, constituting the arefloating gateforeon, is formed on a substrate. A first insulation layer is formed on a sidewall of the conductive pattern, and then a second insulation layer is formed at an upper portion of the conductive pattern in ways that each increase the sharpness of an edge portion where the sidewall and upper portions of the conductive pattern meet. Therefore, electron transference from the floating gate to a control gate is facilitated.