Patents by Inventor Jinmin WU

Jinmin WU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240310243
    Abstract: The present application relates to an interferogram phase estimation method. The interferogram phase estimation method includes: obtaining an interferogram for estimation of a measured object; and inputting the interferogram for estimation to a neural network model trained based on a method for training a neural network model for interferogram phase estimation, to obtain a phase image corresponding to the interferogram for estimation. In the interferogram phase estimation method of the present application, features of different scales of an interferogram are learned based on a Unet++ neural network model to obtain an accurately estimated phase image corresponding to the interferogram.
    Type: Application
    Filed: December 28, 2023
    Publication date: September 19, 2024
    Applicant: BEIJING INSTITUTE OF TECHNOLOGY
    Inventors: Mingfeng LU, Tianshan ZHANG, Peihang LI, Chenchen JI, Jinmin WU, Yao HU, Weidong HU, Feng ZHANG, Ran TAO
  • Patent number: 11156450
    Abstract: A method, device and electronic apparatus for estimating physical parameters are disclosed. The method includes: reading a Newton's rings fringe pattern obtained by performing an interferometric measurement on a unit to be measured; obtaining the number and length of first-direction signals of the Newton's rings fringe pattern; performing, for each of the first-direction signals, a discrete chirp Fourier transform (DCFT) on the first-direction signal based on each first chirp rate parameter within a range of the length of first-direction signals, to obtain a first magnitude spectrum of an intensity distribution signal in a DCFT domain; determining a first chirp rate parameter and a first frequency parameter corresponding to a first magnitude peak value based on the first magnitude spectrum; and estimating the physical parameters involved in the interferometric measurement at least according to the first chirp rate parameter and first frequency parameter corresponding to the first magnitude peak value.
    Type: Grant
    Filed: July 29, 2020
    Date of Patent: October 26, 2021
    Assignee: BEIJING INSTITUTE OF TECHNOLOGY
    Inventors: Mingfeng Lu, Jinmin Wu, Kun Xiong, Xianggen Xia, Feng Zhang, Ran Tao
  • Patent number: 11015922
    Abstract: A physical parameter estimating method, a physical parameter estimating device, and electronic apparatus are disclosed.
    Type: Grant
    Filed: August 19, 2019
    Date of Patent: May 25, 2021
    Assignee: Beijing Institute of Technology
    Inventors: Mingfeng Lu, Jinmin Wu, Ran Tao, Zhen Guo, Feng Zhang
  • Publication number: 20200355487
    Abstract: A method, device and electronic apparatus for estimating physical parameters are disclosed. The method includes: reading a Newton's rings fringe pattern obtained by performing an interferometric measurement on a unit to be measured; obtaining the number and length of first-direction signals of the Newton's rings fringe pattern; performing, for each of the first-direction signals, a discrete chirp Fourier transform (DCFT) on the first-direction signal based on each first chirp rate parameter within a range of the length of first-direction signals, to obtain a first magnitude spectrum of an intensity distribution signal in a DCFT domain; determining a first chirp rate parameter and a first frequency parameter corresponding to a first magnitude peak value based on the first magnitude spectrum; and estimating the physical parameters involved in the interferometric measurement at least according to the first chirp rate parameter and first frequency parameter corresponding to the first magnitude peak value.
    Type: Application
    Filed: July 29, 2020
    Publication date: November 12, 2020
    Applicant: BEIJING INSTITUTE OF TECHNOLOGY
    Inventors: Mingfeng LU, Jinmin WU, Kun XIONG, Xianggen XIA, Feng ZHANG, Ran TAO
  • Publication number: 20190376783
    Abstract: A physical parameter estimating method, a physical parameter estimating device, and electronic apparatus are disclosed.
    Type: Application
    Filed: August 19, 2019
    Publication date: December 12, 2019
    Inventors: Ran TAO, Jinmin WU, Mingfeng LU, Zhen GUO, Feng ZHANG
  • Patent number: 10429169
    Abstract: A physical parameter estimating method, a physical parameter estimating device, and electronic apparatus are disclosed. The method includes: reading a Newton's rings fringe pattern of a unit to be measured; calculating a magnitude spectrum of an intensity distribution signal of at least one first-direction pixel set in the Newton's rings fringe pattern under each fractional Fourier transform (FRFT) order in a searching range of FRFT orders; determining a matched order of the intensity distribution signal according to the calculated magnitude spectrums; and estimating a physical parameter involved in the interferometric measurement according to at least the matched order. Therefore, physical parameters of the unit to be measured can be estimated with high accuracy even in presence of noise and obstacles in the fringe pattern.
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: October 1, 2019
    Assignee: Beijing Institute of Technology
    Inventors: Mingfeng Lu, Jinmin Wu, Feng Zhang, Ran Tao
  • Publication number: 20180051976
    Abstract: A physical parameter estimating method, a physical parameter estimating device, and electronic apparatus are disclosed. The method includes: reading a Newton's rings fringe pattern of a unit to be measured; calculating a magnitude spectrum of an intensity distribution signal of at least one first-direction pixel set in the Newton's rings fringe pattern under each fractional Fourier transform (FRFT) order in a searching range of FRFT orders; determining a matched order of the intensity distribution signal according to the calculated magnitude spectrums; and estimating a physical parameter involved in the interferometric measurement according to at least the matched order. Therefore, physical parameters of the unit to be measured can be estimated with high accuracy even in presence of noise and obstacles in the fringe pattern.
    Type: Application
    Filed: March 2, 2017
    Publication date: February 22, 2018
    Inventors: Mingfeng LU, Jinmin WU, Feng ZHANG, Ran TAO