Abstract: A display device includes a display panel including a first non-folding area, a folding area, and a second non-folding area and a support plate that is disposed under the display panel and that defines a plurality of openings overlapping the folding area and arranged in a first direction and a second direction intersecting the first direction. The support plate includes a first branch disposed between openings adjacent to each other in the second direction among the plurality of openings and a second branch disposed between openings adjacent to each other in the first direction among the plurality of openings. A first width of the first branch in the second direction is smaller than a second width of each of the openings in the second direction.

Abstract: A method and apparatus for detecting a defect in a pattern are provided. The method includes: obtaining a pattern image from a pattern in a region of interest on a semiconductor substrate and obtaining a reference image are obtained; matching the obtained pattern image and the obtained reference image to select a pixel group including pixels indicating defect information of the pattern image; adjusting a defect detection threshold of the selected pixel group; comparing the obtained pattern image and the obtained reference image to detect a pattern defect in a detection region corresponding to the selected pixel group of the pattern image, according to the adjusted defect detection threshold.