Patents by Inventor Jin-Seo CHOI

Jin-Seo CHOI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12245575
    Abstract: An apparatus for controlling a flow rate of water based on an oxygen consumption of a farming target fish is disclosed. The apparatus can include a water temperature meter for measuring a water temperature of an aquaculture tank containing the farming target fish, an automatic feeder for supplying a fish feed to the aquaculture tank, a first oxygen concentration meter for measuring an oxygen concentration in water supplied to the aquaculture tank, a second oxygen concentration meter for measuring an oxygen concentration in water discharged from the aquaculture tank, an oxygen consumption calculator configured to calculate an oxygen consumption of the farming target fish, a water flow rate calculator configured to calculate a flow rate of water to be supplied to the aquaculture tank, and a water supply configured to supply the water to the aquaculture tank.
    Type: Grant
    Filed: November 28, 2023
    Date of Patent: March 11, 2025
    Assignee: PUKYONG NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION
    Inventors: Jeong Hwan Park, Deok Gyu Kim, Ji Hoon Kim, Young Hun Lee, Jin Seo Choi
  • Publication number: 20120155740
    Abstract: A method and apparatus for detecting a defect in a pattern are provided. The method includes: obtaining a pattern image from a pattern in a region of interest on a semiconductor substrate and obtaining a reference image are obtained; matching the obtained pattern image and the obtained reference image to select a pixel group including pixels indicating defect information of the pattern image; adjusting a defect detection threshold of the selected pixel group; comparing the obtained pattern image and the obtained reference image to detect a pattern defect in a detection region corresponding to the selected pixel group of the pattern image, according to the adjusted defect detection threshold.
    Type: Application
    Filed: November 7, 2011
    Publication date: June 21, 2012
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Yong-Min CHO, Jin-Seo CHOI, Dong-Ryul LEE