Patents by Inventor Jinwoo CHAE

Jinwoo CHAE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11087653
    Abstract: An inspection system for a display cell having a display part and a plurality of data lines connected to first and second pixel units of the display part. An array test part and a lighting test part are located in a peripheral area around the display part. An inspection apparatus is configured to provide the array test part with an array control signal to block an array data signal from being applied to a plurality of data lines in a period in which a white image is displayed and to provide the lighting test part with a lighting control signal to block a lighting data signal from being applied to a plurality of data lines during a period in which a black image is displayed, during a drive reliability test mode for displaying a test image including the black image and the white image.
    Type: Grant
    Filed: July 25, 2019
    Date of Patent: August 10, 2021
    Assignee: Samsung Display Co., Ltd.
    Inventors: Dae Youn Cho, Hyunho Kim, Hyojung Kim, Young-Joo Noh, Jongwoo Park, Ju Hee Lee, Jinwoo Chae, Youngtae Choi
  • Publication number: 20200035136
    Abstract: An inspection system for a display cell having a display part and a plurality of data lines connected to first and second pixel units of the display part. An array test part and a lighting test part are located in a peripheral area around the display part. An inspection apparatus is configured to provide the array test part with an array control signal to block an array data signal from being applied to a plurality of data lines in a period in which a white image is displayed and to provide the lighting test part with a lighting control signal to block a lighting data signal from being applied to a plurality of data lines during a period in which a black image is displayed, during a drive reliability test mode for displaying a test image including the black image and the white image.
    Type: Application
    Filed: July 25, 2019
    Publication date: January 30, 2020
    Inventors: Dae Youn CHO, Hyunho KIM, Hyojung KIM, Young-Joo NOH, Jongwoo PARK, Ju Hee LEE, Jinwoo CHAE, Youngtae CHOI