Patents by Inventor Jiri Matejicek

Jiri Matejicek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for determining process-induced stresses and elastic modulus of coatings by in-situ measurement
    Patent number: 6478875
    Abstract: An apparatus for performing in-situ curvature measurement of a substrate during a deposition process is provided which includes a clamp for retaining the substrate near one end while leaving the opposite end free. A plurality of displacement sensors are arranged in a spaced apart fashion along the length of the substrate and are directed to a surface of the substrate opposite a surface to be coated. Each sensor provides a signal to a computer corresponding to a position of the substrate relative to the sensor. The computer receives and stores data from the displacement sensors to determine a stress evolution during a deposition process and to determine a coating modulus based upon a resultant curvature of the substrate.
    Type: Grant
    Filed: March 2, 2000
    Date of Patent: November 12, 2002
    Assignee: The Research Foundation of State University of New York
    Inventors: Sanjay Sampath, Jiri Matejicek