Abstract: The inventive concept provides a teaching method for teaching a transfer position of a transfer robot. The teaching method includes: searching for an object on which a target object to be transferred by the transfer robot is placed, based on a 3D position information acquired by a first sensor; and acquiring coordinates of a second direction and coordinates of a third direction of the object based on a data acquired from a second sensor which is a different type from the first sensor.

Abstract: According to various embodiments of the disclosure, a server device may include a memory, a communication interface, and a processor. The processor may be configured to transmit a service blocking request for a specified user, to an authentication server processing a request of a user terminal, to receive user data for the user from a first server, to transmit the user data to a second server, and to notify the authentication server that the transmission is completed, when the transmission of the user data is completed.

Abstract: According to various embodiments of the disclosure, a server device may include a memory, a communication interface, and a processor. The processor may be configured to transmit a service blocking request for a specified user, to an authentication server processing a request of a user terminal, to receive user data for the user from a first server, to transmit the user data to a second server, and to notify the authentication server that the transmission is completed, when the transmission of the user data is completed.

Abstract: A tester for a mixed signal semiconductor device having a reconstructed digital tester, and a method of testing a semiconductor device using the same are provided. A digital tester electrically tests a digital device and is controlled by a first controller. A metrology instrument module comprising an analog source generator for applying an analog signal to a semiconductor device, an analog waveform digitizer for analyzing the analog signal into a digital signal, and a personal computer including a second controller forms a part of the digital tester, and the first controller is connected to the metrology instrument module through an interface line.