Patents by Inventor Joachim Koenen

Joachim Koenen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8286261
    Abstract: A microscope, in particular a scanning probe microscope, comprising a programmable logic device.
    Type: Grant
    Filed: July 14, 2010
    Date of Patent: October 9, 2012
    Assignee: Witec Wissenchaftliche Instrumente und Technologie GmbH
    Inventors: Peter Spizig, Detief Sanchen, Jörg Förstner, Joachim Koenen, Othmar Marti, Gerhard Volswinkler
  • Patent number: 7877816
    Abstract: Microscope, in particular a scanning probe microscope, comprising a programmable logic device.
    Type: Grant
    Filed: October 23, 2006
    Date of Patent: January 25, 2011
    Assignee: Witec Wissenschaftliche Instrumente und Technologie GmbH
    Inventors: Peter Spizig, Detlef Sanchen, Jörg Förstner, Joachim Koenen, Othmar Marti, Gerhard Volswinkler
  • Publication number: 20100313311
    Abstract: A microscope, in particular a scanning probe microscope, comprising a programmable logic device.
    Type: Application
    Filed: July 14, 2010
    Publication date: December 9, 2010
    Inventors: Peter Spizig, Detief Sanchen, Jörg Förstner, Joachim Koenen, Othmar Marti, Gerhard Volswinkler
  • Publication number: 20070114406
    Abstract: Microscope, in particular a scanning probe microscope, comprising a programmable logic device
    Type: Application
    Filed: October 23, 2006
    Publication date: May 24, 2007
    Applicant: Witec Wissenschaftliche Instrumente und Technologie GmbH
    Inventors: Peter Spizig, Detlef Sanchen, Jorg Forstner, Joachim Koenen, Othmar Marti, Gerhard Volswinkler
  • Patent number: 7129486
    Abstract: The invention relates to a method for creating the image of a sample surface to be analyzed, with a resolution which is better than 1 ?m laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitized using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device.
    Type: Grant
    Filed: December 12, 2001
    Date of Patent: October 31, 2006
    Assignee: Witec Wissenschaftliche Instrumente und Technologie GmbH
    Inventors: Peter Spizig, Detlef Sanchen, Jörg Förstner, Joachim Koenen, Othmar Marti
  • Publication number: 20040084618
    Abstract: The invention relates to a method for creating the image of a sample surface to be analysed, with a resolution which is better than 1 &mgr;m laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitised using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device.
    Type: Application
    Filed: December 1, 2003
    Publication date: May 6, 2004
    Inventors: Peter Spizig, Detlef Sanchen, Jorg Forstner, Joachim Koenen, Othmar Marti