Patents by Inventor Joachim Tabary

Joachim Tabary has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210364663
    Abstract: The invention concerns a method for processing energy spectra of radiation transmitted by an object irradiated by an ionising radiation source, in particular X-ray radiation, for medical imaging or non-destructive testing applications. The method uses a detector comprising a plurality of pixels, each pixel being capable of acquiring a spectrum of the radiation transmitted by the object. The method makes it possible, based on a plurality of detected spectra, to estimate a spectrum, referred to as the scattering spectrum, representative of radiation scattered by the object. The estimation involves taking into account a spatial model of the scattering spectrum. Each acquired spectrum is corrected taking into account the estimated scattering spectrum. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.
    Type: Application
    Filed: October 7, 2019
    Publication date: November 25, 2021
    Applicants: COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE LYON
    Inventors: Odran PIVOT, Joachim TABARY, Clarisse FOURNIER, Jean Michel LETANG, Simon RIT
  • Patent number: 10605749
    Abstract: A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.
    Type: Grant
    Filed: June 25, 2015
    Date of Patent: March 31, 2020
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Caroline Paulus, Joachim Tabary
  • Patent number: 10386508
    Abstract: The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.
    Type: Grant
    Filed: December 23, 2016
    Date of Patent: August 20, 2019
    Assignee: Commissariat A L'Energie Atomique et aux Energies Alternatives
    Inventors: Joachim Tabary, Damien Barbes, Caroline Paulus
  • Patent number: 10371651
    Abstract: The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.
    Type: Grant
    Filed: December 23, 2016
    Date of Patent: August 6, 2019
    Assignee: Commissariat A L'Energie Atomique et aux Energies Alternatives
    Inventors: Damien Barbes, Caroline Paulus, Joachim Tabary
  • Patent number: 10352882
    Abstract: A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.
    Type: Grant
    Filed: June 25, 2015
    Date of Patent: July 16, 2019
    Assignee: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: Caroline Paulus, Joachim Tabary
  • Patent number: 10079078
    Abstract: The invention relates to a method for processing energy spectra of a radiation transmitted by an object irradiated by a source of ionizing radiations, in particular an X radiation, for applications in medical imaging or non-destructive inspection. The method implements a detector comprising a plurality of pixels, each pixel being able to establish a spectrum of the radiation transmitted by the object. The method makes it possible, from a plurality of spectra detected, to establish so-called corrected spectra. Each corrected spectrum is an estimation of the spectrum of a radiation, called primary radiation, transmitted by the object. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: September 18, 2018
    Assignee: Commissariat A L'Energie Atomique et aux Energies Alternatives
    Inventors: Artur Sossin, Veronique Rebuffel, Joachim Tabary
  • Patent number: 9880115
    Abstract: A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: January 30, 2018
    Assignee: Commissariat a l'energie atomique et aux energies alternatives
    Inventors: Caroline Paulus, Joachim Tabary
  • Publication number: 20170184518
    Abstract: The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.
    Type: Application
    Filed: December 23, 2016
    Publication date: June 29, 2017
    Applicant: Commissariat a L'Energie Atomique et aux Energies Alternatives
    Inventors: Damien BARBES, Caroline PAULUS, Joachim TABARY
  • Publication number: 20170184739
    Abstract: The invention is a method of calibrating an X ray diffraction measuring system. The method includes moving a so-called calibration object along a propagation axis along which an irradiation beam propagates, the calibration object being adapted to occupy a plurality of successive positions along that axis. At each position of the object a spectrometry detector including at least one pixel acquires a spectrum of scattering radiation emitted by the object at an acute angle relative to the propagation axis. The method includes, in various spectra corresponding to various respective positions of the object, the identification of a so-called calibration peak and obtaining a parameter of said peak, which parameter can be the intensity or the energy of said peak. The parameters obtained on the various peaks then make it possible to establish an associated pixel dispersion function.
    Type: Application
    Filed: December 23, 2016
    Publication date: June 29, 2017
    Applicant: Commissariat a L'Energie Atomique et aux Energies Alternatives
    Inventors: Joachim TABARY, Damien BARBES, Caroline PAULUS
  • Publication number: 20170153189
    Abstract: A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.
    Type: Application
    Filed: June 25, 2015
    Publication date: June 1, 2017
    Inventors: Caroline PAULUS, Joachim TABARY
  • Publication number: 20170131224
    Abstract: A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1° to 15°, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.
    Type: Application
    Filed: June 25, 2015
    Publication date: May 11, 2017
    Inventors: Caroline PAULUS, Joachim TABARY
  • Publication number: 20170103822
    Abstract: The invention relates to a method for processing energy spectra of a radiation transmitted by an object irradiated by a source of ionizing radiations, in particular an X radiation, for applications in medical imaging or non-destructive inspection. The method implements a detector comprising a plurality of pixels, each pixel being able to establish a spectrum of the radiation transmitted by the object. The method makes it possible, from a plurality of spectra detected, to establish so-called corrected spectra. Each corrected spectrum is an estimation of the spectrum of a radiation, called primary radiation, transmitted by the object. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.
    Type: Application
    Filed: October 7, 2016
    Publication date: April 13, 2017
    Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
    Inventors: ARTUR SOSSIN, VERONIQUE REBUFFEL, JOACHIM TABARY
  • Patent number: 9599580
    Abstract: A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined.
    Type: Grant
    Filed: September 19, 2013
    Date of Patent: March 21, 2017
    Assignees: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, MOZIDO, INC.
    Inventors: Bahaa Ghammraoui, Caroline Paulus, Joachim Tabary
  • Patent number: 9535017
    Abstract: The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (?); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (?materiau (E0, E1, ?)), a configuration for estimating the density (p) of the material.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: January 3, 2017
    Assignee: Commissariat a L'Energie Atomique et aux Energies Alternatives
    Inventors: Caroline Paulus, Joachim Tabary
  • Patent number: 9285329
    Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. The measured are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.
    Type: Grant
    Filed: December 26, 2012
    Date of Patent: March 15, 2016
    Assignee: Commissariat A L'Energie Atomique et Aux Energies Alternatives
    Inventors: Bahaa Ghammraoui, Joachim Tabary, Caroline Paulus
  • Publication number: 20160033427
    Abstract: A method and device that analyzes a sample with a diffractometer that includes a collimated source, a spectrometric detector, and a detection collimator. The sample is irradiated with an incident beam and the detector has a detection plane with multiple physical or virtual pixels. An measured energy spectrum is established for each pixel and each measured energy spectrum is readjusted. The spectrum is expressed as a function of a variable that accounts for the energy of the scattered radiation and an angle of diffraction. The fulfillment of at least one multiple material criterion is verified. Groups of pixels are formed using the results of the verification step, each group corresponding to a layer of material and different groups corresponding to different layers of material, and the spectra are combined by group, during which, for each group, the readjusted spectra for the pixels of the group are combined.
    Type: Application
    Filed: September 19, 2013
    Publication date: February 4, 2016
    Inventors: Bahaa GHAMMRAOUI, Caroline PAULUS, Joachim TABARY
  • Patent number: 9164048
    Abstract: The invention relates to a device for identifying a material of an object having a source of X-Ray photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume (?V) of the material and an energy of the X-Ray photons of the backscattered beam. The incident and backscattered beams forming a scattering angle (?). An adjusting device adjusts the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle. A processing device processes the two magnitudes in two positions and the energy in one position and calculates an attenuation coefficient (?material (E0, E1, ?)). An estimating device estimates the density (?) of the material.
    Type: Grant
    Filed: July 19, 2010
    Date of Patent: October 20, 2015
    Assignee: Commissariat a l'energie atomique et aux energies alternatives
    Inventors: Elisa Fabiani, Jean Rinkel, Joachim Tabary, Jean-Marc Dinten
  • Publication number: 20140369473
    Abstract: The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (?); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (?material (E0, E1, ?)), a configuration for estimating the density (p) of the material.
    Type: Application
    Filed: October 19, 2012
    Publication date: December 18, 2014
    Inventors: Caroline Paulus, Joachim Tabary
  • Publication number: 20140348298
    Abstract: A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined.
    Type: Application
    Filed: December 26, 2012
    Publication date: November 27, 2014
    Inventors: Bahaa Ghammraoui, Joachim Tabary, Caroline Paulus
  • Publication number: 20140286478
    Abstract: A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials.
    Type: Application
    Filed: October 21, 2011
    Publication date: September 25, 2014
    Applicant: Commissariat a l'energie atomique et aux ene alt
    Inventors: Caroline Paulus, Joachim Tabary